loadpatents
name:-0.010389089584351
name:-0.010801076889038
name:-0.0034840106964111
Weber-Grabau; Michael Patent Filings

Weber-Grabau; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weber-Grabau; Michael.The latest application filed is for "method and system for recording and/or monitoring populations of insects".

Company Profile
5.10.8
  • Weber-Grabau; Michael - Sunnyvale CA US
  • Weber-Grabau; Michael - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Object detection systems
Grant 10,914,837 - Weber-Grabau , et al. February 9, 2
2021-02-09
Method And System For Recording And/or Monitoring Populations Of Insects
App 20200367483 - GEIER; Martin ;   et al.
2020-11-26
Object Detection Systems
App 20200209390 - WEBER-GRABAU; Michael ;   et al.
2020-07-02
Object detection systems
Grant 10,585,192 - Weber-Grabau
2020-03-10
Object Detection Systems
App 20190187281 - Weber-Grabau; Michael
2019-06-20
Object detection systems
Grant 10,261,184 - Weber-Grabau
2019-04-16
Object Detection Systems
App 20180203114 - Weber-Grabau; Michael
2018-07-19
Object detection systems
Grant 9,915,732 - Weber-Grabau March 13, 2
2018-03-13
Object Detection Systems
App 20160245916 - Weber-Grabau; Michael
2016-08-25
Object detection systems
Grant 9,335,413 - Weber-Grabau May 10, 2
2016-05-10
Object Detection Systems
App 20150234049 - Weber-Grabau; Michael
2015-08-20
Methods and systems for analyzing a specimen using atomic force microscopy profiling in combination with an optical technique
Grant 7,430,898 - Weber-Grabau , et al. October 7, 2
2008-10-07
Direct relative motion measurement for vibration induced noise and drift cancellation
Grant 7,249,002 - Ben-Dov , et al. July 24, 2
2007-07-24
Wafer metrology apparatus and method
Grant 6,919,958 - Stanke , et al. July 19, 2
2005-07-19
Bathless wafer measurement apparatus and method
App 20020065028 - Weber-Grabau, Michael ;   et al.
2002-05-30
Optical critical dimension metrology system integrated into semiconductor wafer process tool
App 20020018217 - Weber-Grabau, Michael ;   et al.
2002-02-14
Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode
Grant 4,771,172 - Weber-Grabau , et al. September 13, 1
1988-09-13
Company Registrations
SEC0001323394Weber-Grabau Michael

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