Watanabe; Tomohide

Patent Applications and Registrations

Patent applications and USPTO patent grants for Watanabe; Tomohide.The latest application filed is for "pattern inspection device and method of inspecting pattern".

Company Profile

0.7.3

Watanabe; Tomohide - Kanagawa N/A JP
Watanabe; Tomohide - Yokohama JP
Watanabe; Tomohide - Kanagawa-ken JP
Watanabe; Tomohide - Yokohama-shi JP
Watanabe; Tomohide - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern inspection device and method of inspecting pattern Grant 8,358,340 - Yoshikawa , et al. January 22, 2	2013-01-22
Pattern Inspection Device And Method Of Inspecting Pattern App 20090303323 - Yoshikawa; Ryoji ; et al.	2009-12-10
Focusing device, focusing method and a pattern inspecting apparatus Grant 7,394,048 - Inoue , et al. July 1, 2	2008-07-01
Apparatus And Method For Inspecting A Pattern And Method For Manufacturing A Semiconductor Device App 20080055606 - Inoue; Hiromu ; et al.	2008-03-06
Focusing Device, Focusing Method And A Pattern Inspecting Apparatus App 20070200051 - Inoue; Hiromu ; et al.	2007-08-30
Pattern evaluation apparatus and a method of pattern evaluation Grant 5,602,645 - Tabata , et al. February 11, 1	1997-02-11
Method and apparatus for measuring non-linearity of a pattern edge Grant 4,743,768 - Watanabe May 10, 1	1988-05-10
Automatic focusing apparatus for a semiconductor pattern inspection system Grant 4,577,095 - Watanabe March 18, 1	1986-03-18
Automatic focusing apparatus Grant 4,230,940 - Minami , et al. October 28, 1	1980-10-28

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