WATANABE; Hidehiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for WATANABE; Hidehiro.The latest application filed is for "image acquisition apparatus, image acquisition method and defect inspection apparatus".

Company Profile

0.14.11

WATANABE; Hidehiro - Tokyo JP
Watanabe; Hidehiro - Yokohama JP
Watanabe, Hidehiro - Yokohama-Shi JP
Watanabe; Hidehiro - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image Acquisition Apparatus, Image Acquisition Method And Defect Inspection Apparatus App 20150041645 - IIDA; Susumu ; et al.	2015-02-12
Photomask, Semiconductor Device, And Charged Beam Writing Apparatus App 20100237469 - SAITO; Masato ; et al.	2010-09-23
Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing method Grant 7,602,961 - Yoshikawa , et al. October 13, 2	2009-10-13
Image processing method Grant 7,145,702 - Nagata , et al. December 5, 2	2006-12-05
Substrate cleaning method and substrate cleaning apparatus Grant 6,945,259 - Masui , et al. September 20, 2	2005-09-20
Reference data generating method, pattern defect checking apparatus, pattern defect checking method, reference data generating program, and semiconductor device manufacturing method App 20050169513 - Yoshikawa, Ryoji ; et al.	2005-08-04
Ink-jet printing apparatus Grant 6,783,224 - Adachi , et al. August 31, 2	2004-08-31
Ink-jet recording apparatus Grant 6,779,870 - Watanabe , et al. August 24, 2	2004-08-24
Ink-jet printing apparatus App 20040100543 - Adachi, Koichi ; et al.	2004-05-27
Image recording apparatus App 20040100519 - Kikuchi, Noriyuki ; et al.	2004-05-27
Acquisition of MR signals using multiple-quantum-coherence transfer Grant 6,696,889 - Watanabe February 24, 2	2004-02-24
Substrate cleaning method and substrate cleaning apparatus App 20040000324 - Masui, Kenji ; et al.	2004-01-01
Substrate cleaning method and substrate cleaning apparatus Grant 6,632,289 - Masui , et al. October 14, 2	2003-10-14
Image processing method App 20020171882 - Nagata, Yuko ; et al.	2002-11-21
Ink-jet recording apparatus App 20020171708 - Watanabe, Hidehiro ; et al.	2002-11-21
Acquisition of MR signals using multiple-quantum-coherence transfer App 20020101238 - Watanabe, Hidehiro	2002-08-01
Method and apparatus for driving an ink jet head Grant 6,378,973 - Kubota , et al. April 30, 2	2002-04-30
Method and apparatus for driving an ink jet head App 20020041315 - Kubota, Atsushi ; et al.	2002-04-11
Substrate cleaning method and substrate cleaning apparatus App 20010054431 - Masui, Kenji ; et al.	2001-12-27
Temperature monitoring method, temperature monitoring apparatus and magnetic resonance apparatus Grant 6,194,899 - Ishihara , et al. February 27, 2	2001-02-27
Ultrasonic cleaning apparatus and method Grant 5,906,687 - Masui , et al. May 25, 1	1999-05-25
Magnetic resonance diagnostic apparatus Grant 5,677,628 - Watanabe , et al. October 14, 1	1997-10-14
Semiconductor device including insulating film arrangement having low reflectance Grant 5,486,719 - Sugiura , et al. January 23, 1	1996-01-23
MOS transistor Grant 4,979,014 - Hieda , et al. December 18, 1	1990-12-18
Semiconductor memory device with stacked capacitor structure and the manufacturing method thereof Grant 4,951,175 - Kurosawa , et al. August 21, 1	1990-08-21

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