Watabe; Akira

Patent Applications and Registrations

Patent applications and USPTO patent grants for Watabe; Akira.The latest application filed is for "sample holding apparatus for electron microscope, and electron microscope apparatus".

Company Profile

0.8.5

Watabe; Akira - Higashiibaraki N/A JP
Watabe; Akira - Tokyo JP
Watabe; Akira - Ibaraki N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus Grant 9,099,281 - Yaguchi , et al. August 4, 2	2015-08-04
Electron microscope and sample holder Grant 8,878,144 - Yaguchi , et al. November 4, 2	2014-11-04
Sample holding apparatus for electron microscope, and electron microscope apparatus Grant 8,835,847 - Yaguchi , et al. September 16, 2	2014-09-16
Sample Holding Apparatus For Electron Microscope, And Electron Microscope Apparatus App 20140042318 - Yaguchi; Toshie ; et al.	2014-02-13
Electron beam device and sample holding device for electron beam device Grant 8,604,429 - Yaguchi , et al. December 10, 2	2013-12-10
Electron Microscope And Sample Holder App 20120305769 - Yaguchi; Toshie ; et al.	2012-12-06
Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus App 20120212583 - Yaguchi; Toshie ; et al.	2012-08-23
Electron Beam Device And Sample Holding Device For Electron Beam Device App 20110303845 - Yaguchi; Toshie ; et al.	2011-12-15

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