Wasai; Yoko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wasai; Yoko.The latest application filed is for "sample analyzing method, sample analyzing apparatus, manufacturing method of organic el element, manufacturing equipment, and recording medium".

Company Profile

0.6.6

Wasai; Yoko - Kyoto JP
Wasai; Yoko - Nagoya JP
Wasai, Yoko - Aichi JP
Wasai, Yoko - Chikusa-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium Grant 8,013,997 - Nabatova-Gabain , et al. September 6, 2	2011-09-06
Sample Analyzing Method, Sample Analyzing Apparatus, Manufacturing Method Of Organic El Element, Manufacturing Equipment, And Recording Medium App 20100136217 - Nabatova-Gabain; Nataliya ; et al.	2010-06-03
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium Grant 7,688,446 - Nabatova-Gabain , et al. March 30, 2	2010-03-30
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program Grant 7,280,210 - Nabatova-Gabain , et al. October 9, 2	2007-10-09
Thin-film characteristic measuring method using spectroellipsometer Grant 7,271,901 - Nabatova-Gabain , et al. September 18, 2	2007-09-18
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium App 20070121124 - Nabatova-Gabain; Nataliya ; et al.	2007-05-31
Method for analyzing thin-film layer structure using spectroscopic ellipsometer Grant 7,196,793 - Nabatova-Gabain , et al. March 27, 2	2007-03-27
Sample analysis method Grant 7,167,242 - Nabatova-Gabain , et al. January 23, 2	2007-01-23
Sample analysis method App 20050219529 - Nabatova-Gabain, Nataliya ; et al.	2005-10-06
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program App 20050200845 - Nabatova-Gabain, Nataliya ; et al.	2005-09-15
Method for analyzing thin-film layer structure using spectroscopic ellipsometer App 20040265477 - Nabatova-Gabain, Nataliya ; et al.	2004-12-30
Thin-flim characteristic measuring method using spectroellipsometer App 20040207844 - Nabatova-Gabain, Nataliya ; et al.	2004-10-21

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