Wang; Youjin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wang; Youjin.The latest application filed is for "method and system for inspecting an euv mask".
- Wang; Youjin - San Jose CA
- Wang; Youjin - Milpitas CA
- Wang; Youjin - Milptas CA
| Patent | Date |
|---|---|
| Method And System For Inspecting An Euv Mask App 20210172891 - Weng; Guochong ; et al. | 2021-06-10 |
| Method and system for inspecting an EUV mask Grant 10,775,325 - Weng , et al. Sept | 2020-09-15 |
| Load lock system for charged particle beam imaging Grant 10,643,818 - Huang , et al. | 2020-05-05 |
| Load Lock System For Charged Particle Beam Imaging App 20190214225 - HUANG; Hsuan-Bin ; et al. | 2019-07-11 |
| Method And System For Inspecting An Euv Mask App 20190170671 - WENG; Guochong ; et al. | 2019-06-06 |
| Method and system for inspecting an EUV mask Grant 10,088,438 - Weng , et al. October 2, 2 | 2018-10-02 |
| Method and system for inspecting and grounding an EUV mask Grant 9,859,089 - Weng , et al. January 2, 2 | 2018-01-02 |
| Method And System For Inspecting An Euv Mask App 20170052129 - Weng; Guochong ; et al. | 2017-02-23 |
| Method and System for Inspecting an EUV Mask App 20150325402 - Weng; Guochong ; et al. | 2015-11-12 |
| Reticle operation system Grant 9,164,399 - Wang , et al. October 20, 2 | 2015-10-20 |
| Method And System For Inspecting An Euv Mask App 20150102220 - Weng; Guoching ; et al. | 2015-04-16 |
| Reticle Operation System App 20130176549 - Wang; Youjin ; et al. | 2013-07-11 |
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