Wang; You-Jin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; You-Jin.The latest application filed is for "load lock system for charged particle beam imaging".

Company Profile

0.19.15

Wang; You-Jin - Milpitas CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Load lock system for charged particle beam imaging Grant 10,176,967 - Huang , et al. J	2019-01-08
Load Lock System For Charged Particle Beam Imaging App 20180240645 - HUANG; HSUAN-BIN ; et al.	2018-08-23
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 10,054,556 - Wang , et al. August 21, 2	2018-08-21
Structure Electron Beam Inspection System For Inspecting Extreme Ultraviolet Mask And Structure For Discharging Extreme Ultraviolet Mask App 20170053774 - WANG; You-Jin ; et al.	2017-02-23
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 9,572,237 - Wang , et al. February 14, 2	2017-02-14
Discharging method for charged particle beam imaging Grant 9,460,887 - Wang , et al. October 4, 2	2016-10-04
Structure Electron Beam Inspection System For Inspecting Extreme Ultraviolet Mask And Structure For Discharging Extreme Ultraviolet Mask App 20150305131 - WANG; You-Jin ; et al.	2015-10-22
Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask Grant 9,113,538 - Wang , et al. August 18, 2	2015-08-18
Method for inspecting EUV reticle and apparatus thereof Grant 8,692,193 - Kuan , et al. April 8, 2	2014-04-08
Structure For Discharging Extreme Ultraviolet Mask App 20140027634 - WANG; You-Jin ; et al.	2014-01-30
Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system Grant 8,604,428 - Wang , et al. December 10, 2	2013-12-10
Structure for discharging extreme ultraviolet mask Grant 8,575,573 - Wang , et al. November 5, 2	2013-11-05
Structure For Discharging Extreme Ultraviolet Mask App 20120292509 - WANG; You-Jin ; et al.	2012-11-22
Method for venting gas into closed space and gas supply assembly thereof Grant 8,302,420 - Wang November 6, 2	2012-11-06
Method For Inspecting Euv Reticle And Apparatus Thereof App 20120228494 - KUAN; CHIYAN ; et al.	2012-09-13
Method for inspecting EUV reticle and apparatus thereof Grant 8,217,349 - Kuan , et al. July 10, 2	2012-07-10
Method For Inspecting Euv Reticle And Apparatus Thereof App 20120032076 - KUAN; CHIYAN ; et al.	2012-02-09
Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system Grant 8,110,818 - Wang , et al. February 7, 2	2012-02-07
Method Of Controlling Particle Absorption On A Wafer Sample Being Inspected By A Charged Particle Beam Imaging System App 20120006984 - WANG; You-Jin ; et al.	2012-01-12
Apparatus for detecting a sample Grant 8,089,637 - Wang , et al. January 3, 2	2012-01-03
Z-stage configuration and application thereof Grant 8,031,344 - Wang , et al. October 4, 2	2011-10-04
Z-stage Configuration And Application Thereof App 20110101222 - WANG; YOU-JIN ; et al.	2011-05-05
Method and handling apparatus for placing patterning device on support member for charged particle beam imaging Grant 7,868,303 - Wang , et al. January 11, 2	2011-01-11
Patterning device holding apparatus and application thereof Grant 7,838,848 - Huang , et al. November 23, 2	2010-11-23
Dischaging Method For Charged Particle Beam Imaging App 20100288923 - Wang; You-Jin ; et al.	2010-11-18
Method For Venting Gas Into Closed Space And Gas Supply Assembly Thereof App 20100270467 - WANG; YOU-JIN	2010-10-28
Apparatus For Detecting A Sample App 20100165346 - WANG; YOU-JIN ; et al.	2010-07-01
Patterning Device Holding Apparatus And Application Thereof App 20100102226 - HUANG; Hsuan-Bin ; et al.	2010-04-29
Method And Handling Apparatus For Placing Patterning Device On Support Member For Charged Particle Beam Imaging App 20100090107 - WANG; You-Jin ; et al.	2010-04-15
Method Of Controlling Particle Absorption On A Wafer Sample Being Inspected By A Charged Particle Beam Imaging System App 20100084554 - Wang; You-Jin ; et al.	2010-04-08

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