Wang; Yibang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; Yibang.The latest application filed is for "two-port on-wafer calibration piece circuit model and method for determining parameters".

Company Profile

3.3.5

Wang; Yibang - Shijiazhuang CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter Grant 11,385,175 - Wang , et al. July 12, 2	2022-07-12
On-wafer S-parameter calibration method Grant 11,340,286 - Wu , et al. May 24, 2	2022-05-24
Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters App 20220107361 - Wang; Yibang ; et al.	2022-04-07
Method for Determining Parameters in On-Wafer Calibration Piece Model App 20220099736 - Wu; Aihua ; et al.	2022-03-31
Calibration method, system and device of on-wafer s parameter of vector network analyzer Grant 11,275,103 - Wang , et al. March 15, 2	2022-03-15
New On-wafer S-parameter Calibration Method App 20220003811 - WU; Aihua ; et al.	2022-01-06
Calibration Method And Terminal Equipment Of Terahertz Frequency Band On-wafer S Parameter App 20210181102 - Wang; Yibang ; et al.	2021-06-17
Calibration Method, System And Device Of On-wafer S Parameter Of Vector Network Analyzer App 20210003622 - Wang; Yibang ; et al.	2021-01-07

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