loadpatents
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name:-0.06989598274231
name:-0.010618925094604
Wang; Wen-Chuan Patent Filings

Wang; Wen-Chuan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; Wen-Chuan.The latest application filed is for "lithography method with reduced impacts of mask defects".

Company Profile
10.70.78
  • Wang; Wen-Chuan - Hsinchu TW
  • Wang; Wen-Chuan - Hsinchu City TW
  • Wang; Wen-Chuan - New Taipei TW
  • Wang; Wen-Chuan - New Taipei City TW
  • Wang; Wen-Chuan - Hsin-Chu TW
  • Wang; Wen Chuan - Taoyuan TW
  • Wang; Wen-Chuan - Taoyuan County TW
  • Wang; Wen-Chuan - Taipei TW
  • Wang; Wen-Chuan - Taipei County TW
  • Wang; Wen-Chuan - Tainan TW
  • Wang; Wen-Chuan - Taipei City TW
  • Wang; Wen-Chuan - Taipei Hsien TW
  • Wang; Wen-Chuan - Tainan City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer-to-design image analysis (WDIA) system
Grant 11,100,272 - Wu , et al. August 24, 2
2021-08-24
Method of fabricating an integrated circuit with non-printable dummy features
Grant 11,061,317 - Lin , et al. July 13, 2
2021-07-13
Lithography Method With Reduced Impacts of Mask Defects
App 20210208505 - Yu; Shinn-Sheng ;   et al.
2021-07-08
Lithography method with reduced impacts of mask defects
Grant 10,955,746 - Yu , et al. March 23, 2
2021-03-23
Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity
Grant 10,811,225 - Lin , et al. October 20, 2
2020-10-20
Wafer-to-design Image Analysis (wdia) System
App 20200143099 - WU; Cheng-Chi ;   et al.
2020-05-07
Method Of Fabricating An Integrated Circuit With A Pattern Density-outlier-treatment For Optimized Pattern Density Uniformity
App 20200027699 - LIN; Jyuh-Fuh ;   et al.
2020-01-23
System and method for real-time overlay error reduction
Grant 10,495,982 - Chang , et al. De
2019-12-03
Method of Fabricating an Integrated Circuit with Non-Printable Dummy Features
App 20190339610 - Lin; Jyuh-Fuh ;   et al.
2019-11-07
Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity
Grant 10,431,423 - Lin , et al. O
2019-10-01
Method of fabricating an integrated circuit with non-printable dummy features
Grant 10,359,695 - Lin , et al.
2019-07-23
Method Of Fabricating An Integrated Circuit With A Pattern Density-outlier-treatment For Optimized Pattern Density Uniformity
App 20190214227 - LIN; Jyuh-Fuh ;   et al.
2019-07-11
Lithography Method with Reduced Impacts of Mask Defects
App 20190033720 - Yu; Shinn-Sheng ;   et al.
2019-01-31
Verification apparatus and verification method for touch display panel
Grant 10,175,820 - Chang , et al. J
2019-01-08
Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity
Grant 10,170,276 - Lin , et al. J
2019-01-01
Gate driving circuit with isolating switch for display device using the same
Grant 10,008,171 - Sung , et al. June 26, 2
2018-06-26
Driving circuit and driving method
Grant 9,966,032 - Liu , et al. May 8, 2
2018-05-08
Gate Driving Circuit
App 20180061350 - Sung; Wei-Lien ;   et al.
2018-03-01
Method for repairing a mask
Grant 9,870,612 - Yu , et al. January 16, 2
2018-01-16
Method For Repairing A Mask
App 20170352144 - YU; Shinn-Sheng ;   et al.
2017-12-07
Systems and methods for high-throughput and small-footprint scanning exposure for lithography
Grant 9,810,994 - Lin , et al. November 7, 2
2017-11-07
Display Panel
App 20170309238 - Sung; Wei-Lien ;   et al.
2017-10-26
Display panel
Grant 9,792,869 - Sung , et al. October 17, 2
2017-10-17
System and method for maskless direct write lithography
Grant 9,761,411 - Wu , et al. September 12, 2
2017-09-12
Verification Apparatus And Verification Method For Touch Display Panel
App 20170192606 - CHANG; Shao-Lun ;   et al.
2017-07-06
Driving Circuit And Driving Method
App 20170193957 - LIU; Han-Lung ;   et al.
2017-07-06
Method Of Fabricating An Integrated Circuit With A Pattern Density-outlier-treatment For Optimized Pattern Density Uniformity
App 20170186584 - LIN; Jyuh-Fuh ;   et al.
2017-06-29
Method of Fabricating an Integrated Circuit With Non-Printable Dummy Features
App 20170176849 - LIN; JYUH-FUH ;   et al.
2017-06-22
Grid refinement method
Grant 9,678,434 - Wang , et al. June 13, 2
2017-06-13
System and technique for rasterizing circuit layout data
Grant 9,658,538 - Liu , et al. May 23, 2
2017-05-23
Grid Refinement Method
App 20170102624 - Wang; Wen-Chuan ;   et al.
2017-04-13
Systems And Methods For High-throughput And Small-footprint Scanning Exposure For Lithography
App 20170082926 - Lin; Burn Jeng ;   et al.
2017-03-23
Method of fabricating an integrated circuit with non-printable dummy features
Grant 9,594,862 - Lin , et al. March 14, 2
2017-03-14
Electron beam lithography process with multiple columns
Grant 9,589,764 - Wang , et al. March 7, 2
2017-03-07
Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity
Grant 9,552,964 - Lin , et al. January 24, 2
2017-01-24
Grid refinement method
Grant 9,529,271 - Wang , et al. December 27, 2
2016-12-27
Systems and methods for high-throughput and small-footprint scanning exposure for lithography
Grant 9,519,225 - Lin , et al. December 13, 2
2016-12-13
Electron-Beam Lithography Process with Multiple Columns
App 20160284504 - Wang; Wen-Chuan ;   et al.
2016-09-29
Method of fabricating an integrated circuit with optimized pattern density uniformity
Grant 9,436,787 - Lin , et al. September 6, 2
2016-09-06
Method of fabricating an integrated circuit with block dummy for optimized pattern density uniformity
Grant 9,436,788 - Lin , et al. September 6, 2
2016-09-06
Grid Refinement Method
App 20160246912 - WANG; WEN-CHUAN ;   et al.
2016-08-25
System and Method for Maskless Direct Write Lithography
App 20160211117 - Wu; Cheng-Chi ;   et al.
2016-07-21
System And Technique For Rasterizing Circuit Layout Data
App 20160180005 - Liu; Pei-Yi ;   et al.
2016-06-23
Grid refinement method
Grant 9,329,488 - Wang , et al. May 3, 2
2016-05-03
Systems And Methods For High-throughput And Small-footprint Scanning Exposure For Lithography
App 20160091795 - Lin; Burn Jeng ;   et al.
2016-03-31
Grid Refinement Method
App 20160055291 - Wang; Wen-Chuan ;   et al.
2016-02-25
Systems and methods for high-throughput and small-footprint scanning exposure for lithography
Grant 9,229,332 - Lin , et al. January 5, 2
2016-01-05
Method of Fabricating an Integrated Circuit with Non-Printable Dummy Features
App 20150370942 - Lin; Jyuh-Fuh ;   et al.
2015-12-24
Method of Fabricating an Integrated Circuit with a Pattern Density-Outlier-Treatment for Optimized Pattern Density Uniformity
App 20150371821 - Lin; Jyuh-Fuh ;   et al.
2015-12-24
Methods for electron beam patterning
Grant 9,182,660 - Wang , et al. November 10, 2
2015-11-10
Grid refinement method
Grant 9,176,389 - Wang , et al. November 3, 2
2015-11-03
Method of Fabricating an Integrated Circuit with Optimized Pattern Density Uniformity
App 20150294056 - Lin; Jyuh-Fuh ;   et al.
2015-10-15
Method of Fabricating an Integrated Circuit with Block Dummy for Optimized Pattern Density Uniformity
App 20150294057 - Lin; Jyuh-Fuh ;   et al.
2015-10-15
Multiple-patterning overlay decoupling method
Grant 9,134,627 - Wang , et al. September 15, 2
2015-09-15
Capacitor structure of gate driver in panel
Grant 9,064,754 - Lin , et al. June 23, 2
2015-06-23
System and Method for Real-Time Overlay Error Reduction
App 20150116678 - Chang; Shih-Ming ;   et al.
2015-04-30
Capacitor Structure Of Gate Driver In Panel
App 20150102352 - LIN; Shih-Chieh ;   et al.
2015-04-16
Systems And Methods For High-throughput And Small-footprint Scanning Exposure For Lithography
App 20150077731 - Lin; Burn Jeng ;   et al.
2015-03-19
Long-range lithographic dose correction
Grant 8,984,452 - Chen , et al. March 17, 2
2015-03-17
Method for electron beam proximity correction with improved critical dimension accuracy
Grant 8,972,908 - Chen , et al. March 3, 2
2015-03-03
Long-range Lithographic Dose Correction
App 20150052489 - Chen; Cheng-Hung ;   et al.
2015-02-19
Method for Electron Beam Proximity Correction with Improved Critical Dimension Accuracy
App 20150040079 - Chen; Cheng-Hung ;   et al.
2015-02-05
Capacitor structure of gate driver in panel
Grant 8,946,716 - Lin , et al. February 3, 2
2015-02-03
Systems and methods providing electron beam writing to a medium
Grant 8,927,947 - Wang , et al. January 6, 2
2015-01-06
Grid Refinement Method
App 20140368806 - Wang; Wen-Chuan ;   et al.
2014-12-18
Electron beam lithography system and method for improving throughput
Grant 8,852,849 - Shin , et al. October 7, 2
2014-10-07
Capacitor Structure Of Gate Driver In Panel
App 20140291803 - LIN; Shih-Chieh ;   et al.
2014-10-02
Electron beam lithography system and method for improving throughput
Grant 8,846,278 - Shin , et al. September 30, 2
2014-09-30
Multiple-grid exposure method
Grant 8,828,632 - Wang , et al. September 9, 2
2014-09-09
Grid refinement method
Grant 8,822,107 - Wang , et al. September 2, 2
2014-09-02
Grid refinement method
Grant 8,822,106 - Wang , et al. September 2, 2
2014-09-02
Systems And Methods Providing Electron Beam Writing To A Medium
App 20140217305 - Wang; Wen-Chuan ;   et al.
2014-08-07
Holographic reticle and patterning method
Grant 8,758,963 - Chang , et al. June 24, 2
2014-06-24
Vehicle Event Data Recorder Set Capable Of Retaining A Handset
App 20130335567 - Wang; Wen Chuan
2013-12-19
Systems and methods providing electron beam writing to a medium
Grant 8,610,083 - Wang , et al. December 17, 2
2013-12-17
Electron Beam Lithography System and Method for Improving Throughput
App 20130330670 - Shin; Jaw-Jung ;   et al.
2013-12-12
Electron Beam Lithography System and Method For Improving Throughput
App 20130327962 - Shin; Jaw-Jung ;   et al.
2013-12-12
Methods For Electron Beam Patterning
App 20130323918 - Wang; Wen-Chuan ;   et al.
2013-12-05
Non-directional dithering methods
Grant 8,584,057 - Liu , et al. November 12, 2
2013-11-12
Touch Sensing Three-dimensional Display Device
App 20130271388 - Chu; Bo-Han ;   et al.
2013-10-17
Grid Refinement Method
App 20130273474 - Wang; Wen-Chuan ;   et al.
2013-10-17
Grid Refinement Method
App 20130273475 - Wang; Wen-Chuan ;   et al.
2013-10-17
Multiple-grid exposure method
Grant 8,530,121 - Wang , et al. September 10, 2
2013-09-10
Non-directional Dithering Methods
App 20130232453 - Liu; Pei-Yi ;   et al.
2013-09-05
Error Diffusion And Grid Shift In Lithography
App 20130232455 - Liu; Pei-Yi ;   et al.
2013-09-05
Electron beam lithography system and method for improving throughput
Grant 8,524,427 - Shin , et al. September 3, 2
2013-09-03
Error diffusion and grid shift in lithography
Grant 8,510,687 - Liu , et al. August 13, 2
2013-08-13
Multiple-Grid Exposure Method
App 20130203001 - Wang; Wen-Chuan ;   et al.
2013-08-08
Multiple-Patterning Overlay Decoupling Method
App 20130157389 - Wang; Wen-Chuan ;   et al.
2013-06-20
Systems And Methods Providing Electron Beam Writing To A Medium
App 20130146780 - Wang; Wen-Chuan ;   et al.
2013-06-13
Systems and methods providing electron beam writing to a medium
Grant 8,368,037 - Wang , et al. February 5, 2
2013-02-05
Holographic Reticle and Patterning Method
App 20120295185 - Chang; Shih-Ming ;   et al.
2012-11-22
Electron Beam Lithography System And Method For Improving Throughput
App 20120264062 - Shin; Jaw-Jung ;   et al.
2012-10-18
Systems and Methods Providing Electron Beam Writing to a Medium
App 20120235063 - Wang; Wen-Chuan ;   et al.
2012-09-20
Holographic reticle and patterning method
Grant 8,227,150 - Chang , et al. July 24, 2
2012-07-24
Fabrication Method Of Active Device Array Substrate
App 20120100652 - Chen; Shih-Chin ;   et al.
2012-04-26
Active device array substrate and fabrication method thereof
Grant 8,120,032 - Chen , et al. February 21, 2
2012-02-21
System and method for removing particles in semiconductor manufacturing
Grant 8,046,860 - Hsia , et al. November 1, 2
2011-11-01
System And Method For Removing Particles In Semiconductor Manufacturing
App 20110005010 - Hsia; Chen-Yuan ;   et al.
2011-01-13
Holographic Reticle and Patterning Method
App 20100297538 - Chang; Shih-Ming ;   et al.
2010-11-25
Punching bag
Grant 7,824,316 - Wang , et al. November 2, 2
2010-11-02
System and method for removing particles in semiconductor manufacturing
Grant 7,819,980 - Hsia , et al. October 26, 2
2010-10-26
Boxing Sandbag
App 20100240502 - Wang; Yu-Hsiang ;   et al.
2010-09-23
Mask haze early detection
Grant 7,796,249 - Wang , et al. September 14, 2
2010-09-14
Critical dimension (CD) control by spectrum metrology
Grant 7,759,136 - Hung , et al. July 20, 2
2010-07-20
Holographic reticle and patterning method
Grant 7,722,997 - Chang , et al. May 25, 2
2010-05-25
Method and apparatus for compensated illumination for advanced lithography
Grant 7,697,114 - Chang , et al. April 13, 2
2010-04-13
Light Emitting Diode Package And Fabricating Method Thereof
App 20100084683 - Lai; Kou-Rueh ;   et al.
2010-04-08
Active Device Array Substrate And Fabrication Method Thereof
App 20090218571 - Chen; Shih-Chin ;   et al.
2009-09-03
Mask Haze Early Detection
App 20090063074 - Wang; Wen-Chuan ;   et al.
2009-03-05
Method and system for enhancing image resolution using a modification vector
Grant 7,474,788 - Chang , et al. January 6, 2
2009-01-06
Dimension monitoring method and system
Grant 7,460,251 - Chang , et al. December 2, 2
2008-12-02
System and method for examining mask pattern fidelity
Grant 7,383,530 - Wang , et al. June 3, 2
2008-06-03
Holographic Reticle and Patterning Method
App 20080113279 - Chang; Shih-Ming ;   et al.
2008-05-15
Etching bias reduction
Grant 7,316,872 - Chang , et al. January 8, 2
2008-01-08
Holographic reticle and patterning method
Grant 7,312,021 - Chang , et al. December 25, 2
2007-12-25
Method And Apparatus For Compensated Illumination For Advanced Lithography
App 20070291244 - CHANG; Shih-Ming ;   et al.
2007-12-20
System and method for examining mask pattern fidelity
App 20070250805 - Wang; Wen-Chuan ;   et al.
2007-10-25
Novel Critical Dimension (cd) Control By Spectrum Metrology
App 20070231935 - HUNG; Chang-Cheng ;   et al.
2007-10-04
Light Emitting Diode Package And Fabricating Method Thereof
App 20070194422 - Lai; Kou-Rueh ;   et al.
2007-08-23
Etching bias reduction
App 20070087571 - Chang; Shih-Ming ;   et al.
2007-04-19
Dimension monitoring method and system
App 20070075037 - Chang; Shih-Ming ;   et al.
2007-04-05
System and method for removing particles in semiconductor manufacturing
App 20070039631 - Hsia; Chen-Yuan ;   et al.
2007-02-22
Ribbon Cartridge Capable Of Providing A Tension Force To A Ribbon At One End Of A Ribbon-feeding Bay
App 20060269345 - Chiu; Chui-Chien ;   et al.
2006-11-30
Method to improve photomask critical dimension uniformity and photomask fabrication process
Grant 7,060,400 - Wang , et al. June 13, 2
2006-06-13
Method and system for enhancing image resolution
App 20060050965 - Chang; Shih-Ming ;   et al.
2006-03-09
Holographic reticle and patterning method
App 20050147895 - Chang, Shih-Ming ;   et al.
2005-07-07
Method to improve photomask critical dimension uniformity and photomask fabrication process
App 20050031966 - Wang, Wen-Chuan ;   et al.
2005-02-10
Multiple-exposure defect elimination
App 20040265704 - Chang, Shih-Ming ;   et al.
2004-12-30
System and method for examining mask pattern fidelity
App 20040225488 - Wang, Wen-Chuan ;   et al.
2004-11-11
Electron beam shot linearity monitoring
Grant 6,721,939 - Wang , et al. April 13, 2
2004-04-13
Electron beam shot linearity monitoring
App 20030159125 - Wang, Wen-Chuan ;   et al.
2003-08-21

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