Wang; Tien-Wen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; Tien-Wen.The latest application filed is for "inspection system and method".

Company Profile

3.4.5

Wang; Tien-Wen - Hsinchu TW
WANG; Tien-Wen - Hsinchu City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection and cleaning system and method for the same Grant 11,017,522 - Chou , et al. May 25, 2	2021-05-25
System and method for monitoring operation conditions of semiconductor manufacturing apparatus Grant 10,872,793 - Wang , et al. December 22, 2	2020-12-22
Inspection System And Method App 20200334800 - CHOU; Chung-Pin ; et al.	2020-10-22
System And Method For Monitoring Chemical Mechanical Polishing App 20190143474 - WANG; Chih-Yu ; et al.	2019-05-16
System And Method For Monitoring Operation Conditions Of Semiconductor Manufacturing Apparatus App 20190148191 - WANG; Chih-Yu ; et al.	2019-05-16
Automatic statistical process control (SPC) chart generation apparatus and method thereof Grant 7,117,058 - Lin , et al. October 3, 2	2006-10-03
Automatic statistical process control (SPC) chart generation apparatus and method thereof App 20050288810 - Lin, Mu-Tsang ; et al.	2005-12-29
Temperature-sensing wafer position detection system and method Grant 6,980,876 - Lin , et al. December 27, 2	2005-12-27
Temperature-sensing wafer position detection system and method App 20050192699 - Lin, Mu-Tsang ; et al.	2005-09-01

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