Wang; Shu-jin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; Shu-jin.The latest application filed is for "method and apparatus to determine a patterning process parameter".

Company Profile

2.5.7

Wang; Shu-jin - Veldhoven NL
Wang; Shu-jin - Velhoven NL
Wang; Shu-jin - Breugel NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And Apparatus To Determine A Patterning Process Parameter App 20220066330 - TSIATMAS; Anagnostis ; et al.	2022-03-03
Method and apparatus to determine a patterning process parameter Grant 11,143,972 - Tsiatmas , et al. October 12, 2	2021-10-12
Method and apparatus for measuring a parameter of interest using image plane detection techniques Grant 10,983,445 - Pandey , et al. April 20, 2	2021-04-20
Method And Apparatus To Determine A Patterning Process Parameter App 20210035871 - VAN LEEST; Adriaan Johan ; et al.	2021-02-04
Method and apparatus to determine a patterning process parameter Grant 10,811,323 - Van Leest , et al. October 20, 2	2020-10-20
Method And Apparatus For Measuring A Parameter Of Interest Using Image Plane Detection Techniques App 20190250094 - PANDEY; Nitesh ; et al.	2019-08-15
Method And Apparatus To Determine A Patterning Process Parameter App 20190155173 - Tsiatmas; Anagnostis ; et al.	2019-05-23
Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method Grant 9,939,735 - Hinnen , et al. April 10, 2	2018-04-10
Method And Apparatus To Determine A Patterning Process Parameter App 20170255112 - VAN LEEST; Adriaan Johan ; et al.	2017-09-07
Method of Determining Focus, Inspection Apparatus, Patterning Device, Substrate and Device Manufacturing Method App 20170153554 - HINNEN; Paul Christiaan ; et al.	2017-06-01
Method of determining focus, inspection apparatus, patterning device, substrate and device manufacturing method Grant 9,594,299 - Hinnen , et al. March 14, 2	2017-03-14
Method of Determining Focus, Inspection Apparatus, Patterning Device, Substrate and Device Manufacturing Method App 20150338749 - HINNEN; Paul Christiaan ; et al.	2015-11-26

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