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Patent applications and USPTO patent grants for Wang; Mark S..The latest application filed is for "three-dimensional imaging with enhanced resolution".
Patent | Date |
---|---|
Three-dimensional Imaging With Enhanced Resolution App 20220252512 - Liu; Xiumei ;   et al. | 2022-08-11 |
Multimode Defect Classification in Semiconductor Inspection App 20200025689 - Gaind; Vaibhav ;   et al. | 2020-01-23 |
Confocal line inspection optical system Grant 9,927,371 - Wang , et al. March 27, 2 | 2018-03-27 |
Oblique illuminator for inspecting manufactured substrates Grant 9,423,357 - Zhang , et al. August 23, 2 | 2016-08-23 |
Confocal Line Inspection Optical System App 20150369750 - Wang; Mark S. ;   et al. | 2015-12-24 |
Oblique Illuminator For Inspecting Manufactured Substrates App 20140299779 - ZHANG; Shiyu ;   et al. | 2014-10-09 |
Oblique illuminator for inspecting manufactured substrates Grant 8,794,801 - Zhang , et al. August 5, 2 | 2014-08-05 |
Oblique Illuminator For Inspecting Manufactured Substrates App 20120218545 - Zhang; Shiyu ;   et al. | 2012-08-30 |
Serrated Fourier filters and inspection systems Grant 7,397,557 - Jeong , et al. July 8, 2 | 2008-07-08 |
Serrated fourier filters and inspection systems App 20060274305 - Jeong; Hwan J. ;   et al. | 2006-12-07 |
Optical circulator Grant 6,895,129 - Liu , et al. May 17, 2 | 2005-05-17 |
Loop optical circulator Grant 6,747,797 - Liu , et al. June 8, 2 | 2004-06-08 |
Optical circulator App 20030202729 - Liu, Zhimin ;   et al. | 2003-10-30 |
Loop optical circulator App 20030007244 - Liu, Zhimin ;   et al. | 2003-01-09 |
Rapid screening assay methods and devices Grant 5,922,617 - Wang , et al. July 13, 1 | 1999-07-13 |
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