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Grant 10,990,743 - Yuan , et al. April 27, 2 | 2021-04-27 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
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Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based Integrated Circuit
App 20150338461 - Wang; Laung-Terng ; et al. | 2015-11-26 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
Grant 9,121,902 - Wang , et al. September 1, 2 | 2015-09-01 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
Grant 9,110,139 - Wang , et al. August 18, 2 | 2015-08-18 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
Grant 9,057,763 - Wang , et al. June 16, 2 | 2015-06-16 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
Grant 9,026,875 - Wang , et al. May 5, 2 | 2015-05-05 |
Gateway model routing with slits on wires
Grant 8,990,756 - Wang , et al. March 24, 2 | 2015-03-24 |
Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based Integrated Circuit
App 20140344636 - Wang; Laung-Terng ; et al. | 2014-11-20 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
Grant 8,769,359 - Wang , et al. July 1, 2 | 2014-07-01 |
Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based Integrated Circuit
App 20140149816 - Wang; Laung-Terng ; et al. | 2014-05-29 |
Gateway Model Routing with Slits on Wires
App 20140143747 - Wang; Hsin-Po ; et al. | 2014-05-22 |
Multiple-Capture DFT System for Detecting or Locating Crossing Clock-Domain Faults During Self-Test or Scan-Test
App 20140082446 - Wang; Laung-Terng ; et al. | 2014-03-20 |
Multiple-Capture DFT System for Detecting or Locating Crossing Clock-Domain Faults During Self-Test or Scan-Test
App 20140075256 - Wang; Laung-Terng ; et al. | 2014-03-13 |
Method Of Improving Cursor Operation Of Handheld Pointer Device In A Display And Handheld Pointer Device With Improved Cursor Operation
App 20130314318 - Tseng; Ching-Hung ; et al. | 2013-11-28 |
Multiple-Capture DFT System for Detecting or Locating Crossing Clock-Domain Faults During Self-Test or Scan-Test
App 20130268818 - Wang; Laung-Terng ; et al. | 2013-10-10 |
Computer-aided design system to automate scan synthesis at register-transfer level
Grant 8,543,950 - Wang , et al. September 24, 2 | 2013-09-24 |
Computer-aided Design System To Automate Scan Synthesis At Register-transfer Level
App 20120246604 - WANG; Laung-Terng (L. -T.) ; et al. | 2012-09-27 |
Method Of Improving Operation Of Handheld Pointer Device In A Display Screen
App 20120212513 - Tseng; Ching-Hung ; et al. | 2012-08-23 |
Methods and systems for reducing clock skew in a gated clock tree
Grant 8,086,982 - Chang , et al. December 27, 2 | 2011-12-27 |
System for implementing post-silicon IC design changes
Grant 8,015,522 - Wang , et al. September 6, 2 | 2011-09-06 |
Multiple-capture DFT system for scan-based integrated circuits
Grant 7,904,773 - Wang , et al. March 8, 2 | 2011-03-08 |
Power control apparatus and method for an optical drive
Grant 7,808,871 - Wang , et al. October 5, 2 | 2010-10-05 |
Methods And Systems For Reducing Clock Skew In A Gated Clock Tree
App 20100225353 - CHANG; Chia-Ming ; et al. | 2010-09-09 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
Grant 7,779,323 - Wang , et al. August 17, 2 | 2010-08-17 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
Grant 7,721,173 - Wang , et al. May 18, 2 | 2010-05-18 |
Method And Apparatus For Broadcasting Scan Patterns In A Scan-based Integrated Circuit
App 20090235132 - Wang; Laung-Terng ; et al. | 2009-09-17 |
System For Implementing Post-silicon Ic Design Changes
App 20090178013 - Wang; Hsin-Po ; et al. | 2009-07-09 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
Grant 7,552,373 - Wang , et al. June 23, 2 | 2009-06-23 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
App 20090132880 - Wang; Laung-Terng (L.- T.) ; et al. | 2009-05-21 |
Multiple-Capture DFT system for scan-based integrated circuits
App 20090070646 - Wang; Laung-Terng (L.T.) ; et al. | 2009-03-12 |
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
App 20090037786 - Wang; Laung-Terng ; et al. | 2009-02-05 |
IC functional and delay fault testing
Grant 7,461,310 - Wang December 2, 2 | 2008-12-02 |
Method for optimizing write parameters of optical storage medium and recording device therefor
Grant 7,450,482 - Lee , et al. November 11, 2 | 2008-11-11 |
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
Grant 7,444,567 - Wang , et al. October 28, 2 | 2008-10-28 |
Method Of Testing High-speed Ic With Low-speed Ic Tester
App 20080082880 - Wang; Hsin-Po ; et al. | 2008-04-03 |
Computer-aided design system to automate scan synthesis at register-transfer level
Grant 7,331,032 - Wang , et al. February 12, 2 | 2008-02-12 |
IC functional and delay fault testing
App 20070288818 - Wang; Hsin-Po | 2007-12-13 |
Power control apparatus and method for an optical drive
App 20070217299 - Wang; Hsin Po ; et al. | 2007-09-20 |
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
Grant 7,191,373 - Wang , et al. March 13, 2 | 2007-03-13 |
Method For Optimizing Write Parameters Of Optical Storage Medium And Recording Device Therefor
App 20070041293 - Lee; Yao-Yu ; et al. | 2007-02-22 |
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
Grant 7,058,869 - Abdel-Hafez , et al. June 6, 2 | 2006-06-06 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
Grant 7,007,213 - Wang , et al. February 28, 2 | 2006-02-28 |
Multiple-capture DFT system for scan-based integrated circuits
App 20050235186 - Wang, Laung-Terng ; et al. | 2005-10-20 |
Multiple-capture DFT system for scan-based integrated circuits
Grant 6,954,887 - Wang , et al. October 11, 2 | 2005-10-11 |
Method and apparatus for unifying self-test with scan-test during prototype debug and production test
App 20040268181 - Wang, Laung-Terng ; et al. | 2004-12-30 |
Method and apparatus for debug, diagnosis, and yield improvement of scan-based integrated circuits
App 20040237015 - Abdel-Hafez, Khader S. ; et al. | 2004-11-25 |
Method and apparatus for testing asynchronous set/reset faults in a scan-based integrated circuit
App 20040153926 - Abdel-Hafez, Khader S. ; et al. | 2004-08-05 |
Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
App 20030154433 - Wang, Laung-Terng ; et al. | 2003-08-14 |
Computer-aided design system to automate scan synthesis at register-transfer level
App 20030023941 - Wang, Laung-Terng (L.-T.) ; et al. | 2003-01-30 |
Method and system to optimize test cost and disable defects for scan and BIST memories
App 20020194558 - Wang, Laung-Terng ; et al. | 2002-12-19 |
Multiple-capture DFT system for scan-based integrated circuits
App 20020184560 - Wang, Laung-Terng ; et al. | 2002-12-05 |
Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
App 20020138801 - Wang, Laung-Terng ; et al. | 2002-09-26 |
Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test
App 20020120896 - Wang, Laung-Terng ; et al. | 2002-08-29 |
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