Wang; Gaoyu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wang; Gaoyu.The latest application filed is for "method for detecting ultra-small defect on wafer surface".
- Wang; Gaoyu - Shanghai CN
- Wang; Gaoyu - Beijing CN
| Patent | Date |
|---|---|
| Method for detecting ultra-small defect on wafer surface Grant 11,121,045 - Hu , et al. September 14, 2 | 2021-09-14 |
| Method and apparatus for generating image parameter for reproducible virtual character Grant 11,052,316 - Wang , et al. July 6, 2 | 2021-07-06 |
| Method for Detecting Ultra-Small Defect on Wafer Surface App 20210057289 - Hu; Xianghua ; et al. | 2021-02-25 |
| Method And Apparatus For Generating Image Parameter For Reproducible Virtual Character App 20200298120 - WANG; Gaoyu ; et al. | 2020-09-24 |
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