loadpatents
name:-0.073944091796875
name:-0.031397104263306
name:-0.020307064056396
Wang; Chen-Han Patent Filings

Wang; Chen-Han

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wang; Chen-Han.The latest application filed is for "low thermal budget dielectric for semiconductor devices".

Company Profile
5.8.17
  • Wang; Chen-Han - Zhubei City TW
  • Wang; Chen-Han - Zhubei TW
  • Wang; Chen-Han - Hsinchu County TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Low Thermal Budget Dielectric For Semiconductor Devices
App 20220293458 - Khaderbad; Mrunal Abhijith ;   et al.
2022-09-15
Air Spacer Formation With A Spin-on Dielectric Material
App 20220285492 - CHEN; Ting-Ting ;   et al.
2022-09-08
Gate all around structure with additional silicon layer and method for forming the same
Grant 11,430,891 - Wang , et al. August 30, 2
2022-08-30
Seal Material For Air Gaps In Semiconductor Devices
App 20220223686 - Liang; Shuen-Shin ;   et al.
2022-07-14
Spacer Structure For Semiconductor Device
App 20220190137 - Wang; Chen-Han ;   et al.
2022-06-16
Interconnect Structure And Method For Manufacturing The Interconnect Structure
App 20220189871 - MRUNAL ABHIJITH; KHADERBAD ;   et al.
2022-06-16
Seal material for air gaps in semiconductor devices
Grant 11,296,187 - Liang , et al. April 5, 2
2022-04-05
Spacer structure for semiconductor device
Grant 11,264,485 - Wang , et al. March 1, 2
2022-03-01
Interconnect structure and method for manufacturing the interconnect structure
Grant 11,257,753 - Mrunal Abhijith , et al. February 22, 2
2022-02-22
Tunable Low-k Inner Air Spacers Of Semiconductor Devices
App 20210407856 - Wang; Chen-Han ;   et al.
2021-12-30
Interconnect Structure And Method For Manufacturing The Interconnect Structure
App 20210225762 - MRUNAL ABHIJITH; KHADERBAD ;   et al.
2021-07-22
Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures
Grant 11,063,042 - Wang , et al. July 13, 2
2021-07-13
Seal Material For Air Gaps In Semiconductor Devices
App 20210193799 - LIANG; Shuen-Shin ;   et al.
2021-06-24
Bilayer Seal Material For Air Gaps In Semiconductor Devices
App 20210193506 - LIANG; Shuen-Shin ;   et al.
2021-06-24
Seal Material For Air Gaps In Semiconductor Devices
App 20210193798 - Liang; Shuen-Shin ;   et al.
2021-06-24
Spacer Structure For Semiconductor Device
App 20210126106 - WANG; Chen-Han ;   et al.
2021-04-29
Semiconductor Structure And Method For Forming The Same
App 20210083090 - WANG; Chen-Han ;   et al.
2021-03-18
Method and Device of Preventing Merging of Resist-Protection-Oxide (RPO) Between Adjacent Structures
App 20200043923 - Wang; Chen-Han ;   et al.
2020-02-06
Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures
Grant 10,461,079 - Wang , et al. Oc
2019-10-29
Method and device of preventing merging of resist-protection-oxide (RPO) between adjacent structures
Grant 10,438,948 - Wang , et al. O
2019-10-08
Method And Device Of Preventing Merging Of Resist-protection-oxide (rpo) Between Adjacent Structures
App 20180350805 - Wang; Chen-Han ;   et al.
2018-12-06
In-line Device Electrical Property Estimating Method And Test Structure Of The Same
App 20170356953 - WANG; Chen-Han ;   et al.
2017-12-14
Method And Device Of Preventing Merging Of Resist-protection-oxide (rpo) Between Adjacent Structures
App 20170221890 - Wang; Chen-Han ;   et al.
2017-08-03
Epitaxial source/drain regions in FinFETs and methods for forming the same
Grant 9,496,398 - Lee , et al. November 15, 2
2016-11-15
Epitaxial Source/Drain Regions in FinFETs and Methods for Forming the Same
App 20150200271 - Lee; Tung Ying ;   et al.
2015-07-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed