Wakiyama; Shigeru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wakiyama; Shigeru.The latest application filed is for "actuator position calculation device, actuator position calculation method, and actuator position calculation program".

Company Profile

0.14.11

Wakiyama; Shigeru - Tokyo JP
Wakiyama; Shigeru - Chiba N/A JP
Wakiyama; Shigeru - Chiba-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Actuator position calculation device, actuator position calculation method, and actuator position calculation program Grant 9,766,267 - Shigeno , et al. September 19, 2	2017-09-19
Actuator Position Calculation Device, Actuator Position Calculation Method, and Actuator Position Calculation Program App 20140297222 - Shigeno; Masatsugu ; et al.	2014-10-02
Probe aligning method for probe microscope and probe microscope operated by the same Grant 8,495,759 - Wakiyama , et al. July 23, 2	2013-07-23
Apparatus structure and scanning probe microscope including apparatus structure Grant 7,945,964 - Wakiyama , et al. May 17, 2	2011-05-17
Probe Aligning Method For Probe Microscope And Probe Microscope Operated By The Same App 20100031402 - Wakiyama; Shigeru ; et al.	2010-02-04
Apparatus Structure And Scanning Probe Microscope Including Apparatus Structure App 20090255016 - Wakiyama; Shigeru ; et al.	2009-10-08
Processing probe Grant 7,378,654 - Wakiyama , et al. May 27, 2	2008-05-27
Scanning probe microscope and scanning method Grant 7,373,806 - Kitajima , et al. May 20, 2	2008-05-20
Method of processing vertical cross-section using atomic force microscope Grant 7,278,299 - Takaoka , et al. October 9, 2	2007-10-09
Processing method using probe of scanning probe microscope Grant 7,259,372 - Takaoka , et al. August 21, 2	2007-08-21
Method of removing particle of photomask using atomic force microscope Grant 7,232,995 - Takaoka , et al. June 19, 2	2007-06-19
Method of removing particle of photomask using atomic force microscope App 20060022134 - Takaoka; Osamu ; et al.	2006-02-02
Processing method using probe of scanning probe microscope App 20050263700 - Takaoka, Osamu ; et al.	2005-12-01
Method of processing vertical cross-section using atomic force microscope App 20050262685 - Takaoka, Osamu ; et al.	2005-12-01
Processing probe App 20050199809 - Wakiyama, Shigeru ; et al.	2005-09-15
Scanning probe microscope and scanning method App 20050050947 - Kitajima, Itaru ; et al.	2005-03-10
Electrochemical cell App 20040209163 - Watanabe, Shunji ; et al.	2004-10-21
Method and system for surface or cross-sectional processing and observation App 20040154744 - Kaito, Takashi ; et al.	2004-08-12
Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof Grant 6,355,495 - Fujino , et al. March 12, 2	2002-03-12
Surface analyzing apparatus App 20010048076 - Wakiyama, Shigeru ; et al.	2001-12-06
Surface analyzing apparatus Grant 6,259,093 - Wakiyama , et al. July 10, 2	2001-07-10
Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same Grant 5,877,035 - Fujino , et al. March 2, 1	1999-03-02
Tunnel current detecting photo-acoustic spectrometer Grant 4,921,346 - Tokumoto , et al. May 1, 1	1990-05-01
Relative displacement control apparatus Grant 4,866,271 - Ono , et al. September 12, 1	1989-09-12

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