Wakefield; Ray
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wakefield; Ray.The latest application filed is for "probe card and method for using probe card, wafer prober utilizing same".
- Wakefield; Ray - Palo Alto CA
- Wakefield; Ray - Santa Clara CA
| Patent | Date |
|---|---|
| Method for using probe card Grant 8,120,375 - Foster , et al. February 21, 2 | 2012-02-21 |
| System for testing DUT and tester for use therewith Grant 7,385,385 - Magliocco , et al. June 10, 2 | 2008-06-10 |
| Probe card and method for using probe card, wafer prober utilizing same App 20060279302 - Foster; Craig Z. ; et al. | 2006-12-14 |
| Apparatus for planarizing a probe card and method using same Grant 7,098,650 - Foster , et al. August 29, 2 | 2006-08-29 |
| Apparatus for planarizing a probe card and method using same App 20050062464 - Foster, Craig Z. ; et al. | 2005-03-24 |
| Stackable semiconductor test system and method for operating same App 20030062888 - Magliocco, Paul ; et al. | 2003-04-03 |
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