Wakai; Hideyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wakai; Hideyuki.The latest application filed is for "wear amount measuring device, wear amount measuring method, wear amount measuring program and storage medium".

Company Profile

0.8.3

Wakai; Hideyuki - Yashio N/A JP
Wakai; Hideyuki - Yashio-shi JP
Wakai; Hideyuki - Hiratsuka-shi JP
Wakai, Hideyuki - Kanagawa JP
Wakai; Hideyuki - Toyonaka JP
Wakai; Hideyuki - Hiratsuka JP
Wakai; Hideyuki - Hirakata JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wear amount measuring device, wear amount measuring method, wear amount measuring program and storage medium Grant 9,121,697 - Marumoto , et al. September 1, 2	2015-09-01
Wear Amount Measuring Device, Wear Amount Measuring Method, Wear Amount Measuring Program And Storage Medium App 20120306916 - Marumoto; Shigeto ; et al.	2012-12-06
Wafer temperature measuring method and apparatus App 20070009010 - Shio; Koji ; et al.	2007-01-11
Database Management system and database App 20030041071 - Wakai, Hideyuki ; et al.	2003-02-27
Work instruction system and conveyance control system in production line Grant 5,793,638 - Yao , et al. August 11, 1	1998-08-11
Confocal optical apparatus Grant 5,659,420 - Wakai , et al. August 19, 1	1997-08-19
Three-dimensional image measuring device Grant 5,448,360 - Wakai , et al. September 5, 1	1995-09-05
Three-dimensional image display device Grant 5,430,560 - Wakai , et al. July 4, 1	1995-07-04
Method and device for detecting tool abnormality in machine tools Grant 4,456,960 - Wakai June 26, 1	1984-06-26
Cutting tool retreat and return for workpiece protection upon abnormality occurrence in a preprogrammed machine tool Grant 4,442,493 - Wakai , et al. April 10, 1	1984-04-10

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