Wakaba; Hiroshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wakaba; Hiroshi.The latest application filed is for "inspection system and inspection method".
- Wakaba; Hiroshi - Yokohama N/A JP
- WAKABA; Hiroshi - Yokohama-shi JP
- Wakaba; Hiroshi - Kanagawa JP
| Patent | Date |
|---|---|
| Feature analyzing apparatus for a surface of an object Grant 8,700,498 - Hayashi , et al. April 15, 2 | 2014-04-15 |
| Substrate surface inspecting apparatus and substrate surface inspecting method Grant 8,508,246 - Wakaba , et al. August 13, 2 | 2013-08-13 |
| Inspection method based on captured image and inspection device Grant 8,497,985 - Hayashi , et al. July 30, 2 | 2013-07-30 |
| Inspection device for disk-shaped substrate Grant 8,488,867 - Hayashi , et al. July 16, 2 | 2013-07-16 |
| Illumination System, Illumination Method, And Inspection System App 20130169795 - HAYASHI; Yoshinori ; et al. | 2013-07-04 |
| Inspection System And Inspection Method App 20130169793 - HAYASHI; Yoshinori ; et al. | 2013-07-04 |
| Feature Analyzing Apparatus App 20100310150 - Hayashi; Yoshinori ; et al. | 2010-12-09 |
| Substrate Surface Inspecting Apparatus And Substrate Surface Inspecting Method App 20100310152 - Wakaba; Hiroshi ; et al. | 2010-12-09 |
| Inspection Method Based On Captured Image And Inspection Device App 20100245810 - Hayashi; Yoshinori ; et al. | 2010-09-30 |
| Inspection Device For Disk-shaped Substrate App 20100246934 - Hayashi; Yoshinori ; et al. | 2010-09-30 |
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