Patent | Date |
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Per-shift X-tolerant logic built-in self-test Grant 11,422,186 - Waicukauski , et al. August 23, 2 | 2022-08-23 |
Reducing X-masking effect for linear time compactors Grant 10,908,213 - Gizdarski , et al. February 2, 2 | 2021-02-02 |
Diagnosis and debug with truncated simulation Grant 9,404,972 - Wohl , et al. August 2, 2 | 2016-08-02 |
Diagnosis And Debug With Truncated Simulation App 20160025810 - Wohl; Peter ;   et al. | 2016-01-28 |
Diagnosis and debug using truncated simulation Grant 9,171,123 - Wohl , et al. October 27, 2 | 2015-10-27 |
Two-level compression through selective reseeding Grant 9,157,961 - Wohl , et al. October 13, 2 | 2015-10-13 |
Increasing PRPG-based compression by delayed justification Grant 9,152,752 - Wohl , et al. October 6, 2 | 2015-10-06 |
Diagnosis And Debug Using Truncated Simulation App 20150067629 - Wohl; Peter ;   et al. | 2015-03-05 |
Two-Level Compression Through Selective Reseeding App 20140281774 - Wohl; Peter ;   et al. | 2014-09-18 |
Fully X-tolerant, very high scan compression scan test systems and techniques Grant 8,645,780 - Wohl , et al. February 4, 2 | 2014-02-04 |
Fully X-Tolerant, Very High Scan Compression Scan Test Systems And Techniques App 20130268817 - Wohl; Peter ;   et al. | 2013-10-10 |
ATPG and compression by using majority gates Grant 8,549,372 - Wohl , et al. October 1, 2 | 2013-10-01 |
Atpg And Compression By Using Majority Gates App 20130232459 - Wohl; Peter ;   et al. | 2013-09-05 |
Increasing PRPG-Based Compression By Delayed Justification App 20130232458 - Wohl; Peter ;   et al. | 2013-09-05 |
Fully X-tolerant, very high scan compression scan test systems and techniques Grant 8,464,115 - Wohl , et al. June 11, 2 | 2013-06-11 |
Increasing PRPG-based compression by delayed justification Grant 8,429,473 - Wohl , et al. April 23, 2 | 2013-04-23 |
Fully X-tolerant, Very High Scan Compression Scan Test Systems And Techniques App 20110258503 - Wohl; Peter ;   et al. | 2011-10-20 |
Increasing PRPG-Based Compression by Delayed Justification App 20110231805 - Wohl; Peter ;   et al. | 2011-09-22 |
Fully X-tolerant, very high scan compression scan test systems and techniques Grant 7,979,763 - Wohl , et al. July 12, 2 | 2011-07-12 |
Increasing scan compression by using X-chains Grant 7,958,472 - Wohl , et al. June 7, 2 | 2011-06-07 |
Launch-on-shift support for on-chip-clocking Grant 7,882,410 - Ayres , et al. February 1, 2 | 2011-02-01 |
Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit Grant 7,823,034 - Wohl , et al. October 26, 2 | 2010-10-26 |
Scan compression circuit and method of design therefor Grant 7,814,444 - Wohl , et al. October 12, 2 | 2010-10-12 |
Fully X-Tolerant, Very High Scan Compression Scan Test Systems And Techniques App 20100100781 - Wohl; Peter ;   et al. | 2010-04-22 |
Increasing Scan Compression By Using X-Chains App 20100083199 - Wohl; Peter ;   et al. | 2010-04-01 |
Launch-On-Shift Support for On-Chip-Clocking App 20080320348 - Ayres; Timothy N. ;   et al. | 2008-12-25 |
Scan compression circuit and method of design therefor App 20080256497 - Wohl; Peter ;   et al. | 2008-10-16 |
Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit App 20080256274 - Wohl; Peter ;   et al. | 2008-10-16 |
Deterministic BIST architecture tolerant of uncertain scan chain outputs Grant 7,237,162 - Wohl , et al. June 26, 2 | 2007-06-26 |
Deterministic bist architecture including MISR filter Grant 6,993,694 - Kapur , et al. January 31, 2 | 2006-01-31 |
Efficient compression and application of deterministic patterns in a logic BIST architecture Grant 6,950,974 - Wohl , et al. September 27, 2 | 2005-09-27 |
System and method for time slicing deterministic patterns for reseeding in logic built-in self-test Grant 6,807,646 - Williams , et al. October 19, 2 | 2004-10-19 |
Method And System For Generating An Atpg Model Of A Memory From Behavioral Descriptions App 20040167764 - Wohl, Peter ;   et al. | 2004-08-26 |
Hybrid pattern self-testing of integrated circuits Grant 5,612,963 - Koenemann , et al. March 18, 1 | 1997-03-18 |
Weighted random pattern testing apparatus and method Grant 4,801,870 - Eichelberger , et al. January 31, 1 | 1989-01-31 |
Weighted random pattern testing apparatus and method Grant 4,745,355 - Eichelberger , et al. May 17, 1 | 1988-05-17 |
Weighted random pattern testing apparatus and method Grant 4,687,988 - Eichelberger , et al. August 18, 1 | 1987-08-18 |
Weighted random pattern testing apparatus and method Grant 4,688,223 - Motika , et al. August 18, 1 | 1987-08-18 |