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name:-0.01451301574707
name:-0.014738082885742
name:-0.00057196617126465
Wahlsten; Mikael Patent Filings

Wahlsten; Mikael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wahlsten; Mikael.The latest application filed is for "methods and apparatuses for generating patterns on workpieces".

Company Profile
0.21.14
  • Wahlsten; Mikael - Stockholm SE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Pick-and-place tool
Grant 9,648,795 - Gustafsson , et al. May 9, 2
2017-05-09
Method and apparatus for performing pattern alignment to die
Grant 9,341,962 - Wahlsten , et al. May 17, 2
2016-05-17
Apparatuses and methods for compensation of carrier distortions from measurement machines
Grant 9,210,814 - Wahlsten December 8, 2
2015-12-08
Apparatus for generating patterns on workpieces
Grant 9,032,611 - Gustafsson , et al. May 19, 2
2015-05-19
Method and apparatus for alignment optimization with respect to plurality of layers
Grant 9,032,342 - Wahlsten , et al. May 12, 2
2015-05-12
Methods And Apparatuses For Generating Patterns On Workpieces
App 20150082620 - GUSTAFSSON; Per-Erik ;   et al.
2015-03-26
Method and apparatus for performing alignment using reference board
Grant 8,934,081 - Wahlsten , et al. January 13, 2
2015-01-13
Method and apparatus for alignment optimization with respect to plurality of layers for writing different layers with different machine configurations
Grant 8,594,825 - Wahlsten , et al. November 26, 2
2013-11-26
Method and apparatus for performing pattern alignment to plurality of dies
Grant 8,594,824 - Wahlsten , et al. November 26, 2
2013-11-26
Method and apparatus for performing pattern reconnection after individual or multipart alignment
Grant 8,530,120 - Wahlsten , et al. September 10, 2
2013-09-10
Methods and Apparatuses For Generating Patterns On Workpieces
App 20120066898 - Gustafsson; Per-Erik ;   et al.
2012-03-22
Method and apparatus for overlay compensation between subsequently patterned layers on workpiece
Grant 8,137,875 - Sjostrom , et al. March 20, 2
2012-03-20
Apparatuses And Methods For Compensation Of Carrier Distortions From Measurement Machines
App 20120062862 - Wahlsten; Mikael
2012-03-15
Method of iterative compensation for non-linear effects in three-dimensional exposure of resist
Grant 8,067,134 - Sandstrom , et al. November 29, 2
2011-11-29
Method of compensation for bleaching of resist during three-dimensional exposure of resist
Grant 8,057,971 - Sandstrom , et al. November 15, 2
2011-11-15
Method and apparatus for performing pattern reconnection after individual or multipart alignment
App 20110257777 - Wahlsten; Mikael ;   et al.
2011-10-20
Method and apparatus for performing alignment using reference board
App 20110228242 - Wahlsten; Mikael ;   et al.
2011-09-22
Method and apparatus for performing pattern alignment to die
App 20110213479 - Wahlsten; Mikael ;   et al.
2011-09-01
Method and apparatus for performing pattern alignment to plurality of dies
App 20110213484 - Wahlsten; Mikael ;   et al.
2011-09-01
Method and apparatus for alignment optimization with respect to plurality of layers
App 20110210104 - Wahlsten; Mikael ;   et al.
2011-09-01
Method and apparatus for alignment optimization with respect to plurality of layers for writing different layers with different machine configurations
App 20110213487 - Wahlsten; Mikael ;   et al.
2011-09-01
Multi-focus method of enhanced three-dimensional exposure of resist
Grant 7,923,182 - Sandstrom , et al. April 12, 2
2011-04-12
Multi-focus Method Of Enhanced Three-dimensional Exposure Of Resist
App 20100099051 - Sandstrom; Torbjorn ;   et al.
2010-04-22
Method Of Compensation For Bleaching Of Resist During Three-dimensional Exposure Of Resist
App 20100099034 - Sandstrom; Torbjorn ;   et al.
2010-04-22
Method Of Iterative Compensation For Non-linear Effects In Three-dimensional Exposure Of Resist
App 20100099035 - Sandstrom; Torbjorn ;   et al.
2010-04-22
Method and apparatus for overlay compensation between subsequently patterned layers on workpiece
App 20090325088 - Sjostrom; Fredrik ;   et al.
2009-12-31
Apparatuses, Methods And Computer Programs For Artificial Resolution Enhancement In Optical Systems
App 20070201732 - Wahlsten; Mikael
2007-08-30

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