Wagner; Grant W.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wagner; Grant W..The latest application filed is for "probe card assembly".
- Wagner; Grant W. - Jericho VT
- Wagner; Grant W. - Burlington VT
- Wagner; Grant W. - South Burlington VT
| Patent | Date |
|---|---|
| Probe card assembly Grant 11,085,949 - Audette , et al. August 10, 2 | 2021-08-10 |
| Low force wafer test probe Grant 11,029,334 - Audette , et al. June 8, 2 | 2021-06-08 |
| Low force wafer test probe with variable geometry Grant 10,663,487 - Audette , et al. | 2020-05-26 |
| Probe card assembly Grant 10,578,648 - Audette , et al. | 2020-03-03 |
| Probe Card Assembly App 20200049738 - AUDETTE; David M. ; et al. | 2020-02-13 |
| Low Force Wafer Test Probe App 20190361048 - Audette; David M. ; et al. | 2019-11-28 |
| Low force wafer test probe Grant 10,444,260 - Audette , et al. Oc | 2019-10-15 |
| Low Force Wafer Test Probe With Variable Geometry App 20190195913 - Audette; David M. ; et al. | 2019-06-27 |
| Low force wafer test probe with variable geometry Grant 10,261,108 - Audette , et al. | 2019-04-16 |
| Low Force Wafer Test Probe With Variable Geometry App 20180017596 - Audette; David M. ; et al. | 2018-01-18 |
| Low Force Wafer Test Probe App 20180017592 - Audette; David M. ; et al. | 2018-01-18 |
| Probe Card Assembly App 20170356933 - AUDETTE; David M. ; et al. | 2017-12-14 |
| Probe card assembly Grant 9,797,928 - Audette , et al. October 24, 2 | 2017-10-24 |
| Probe Card Assembly App 20160077129 - AUDETTE; David M. ; et al. | 2016-03-17 |
| Methodologies and test configurations for testing thermal interface materials Grant 9,116,200 - Fregeau , et al. August 25, 2 | 2015-08-25 |
| Rigid probe with compliant characteristics Grant 9,086,433 - Audette , et al. July 21, 2 | 2015-07-21 |
| Rigid probe with compliant characteristics Grant 9,081,034 - Audette , et al. July 14, 2 | 2015-07-14 |
| Rigid Probe With Compliant Characteristics App 20140167801 - Audette; David M. ; et al. | 2014-06-19 |
| Rigid Probe With Compliant Characteristics App 20140167802 - Audette; David M. ; et al. | 2014-06-19 |
| Methodologies And Test Configurations For Testing Thermal Interface Materials App 20130229198 - FREGEAU; Dustin ; et al. | 2013-09-05 |
| Methodologies and test configurations for testing thermal interface materials Grant 8,471,575 - Fregeau , et al. June 25, 2 | 2013-06-25 |
| Methodologies and Test Configurations for Testing Thermal Interface Materials App 20110267082 - FREGEAU; Dustin ; et al. | 2011-11-03 |
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