Waggoner; Gary Robert
Patent Applications and Registrations
Patent applications and USPTO patent grants for Waggoner; Gary Robert.The latest application filed is for "supporting scan functions within memories".
- Waggoner; Gary Robert - San Jose CA
| Patent | Date |
|---|---|
| Integrated circuit and method for testing memory on the integrated circuit Grant 8,145,958 - Aitken , et al. March 27, 2 | 2012-03-27 |
| Method and apparatus for handling fuse data for repairing faulty elements within an IC Grant 8,112,681 - Khoja , et al. February 7, 2 | 2012-02-07 |
| Supporting scan functions within memories Grant 8,045,401 - Chong , et al. October 25, 2 | 2011-10-25 |
| Supporting scan functions within memories App 20110072323 - Chong; Yew Keong ; et al. | 2011-03-24 |
| Serial scan chain control within an integrated circuit Grant 7,734,974 - Aitken , et al. June 8, 2 | 2010-06-08 |
| Electronic fuses App 20090190422 - Khoja; Faisal Ramzan Ali ; et al. | 2009-07-30 |
| Serial scan chain control within an integrated circuit App 20090019329 - Aitken; Robert Campbell ; et al. | 2009-01-15 |
| Integrated circuit and method for testing memory on the integrated circuit App 20070106923 - Aitken; Robert Campbell ; et al. | 2007-05-10 |
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