VYSTAVEL; Tomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for VYSTAVEL; Tomas.The latest application filed is for "data acquisition and processing techniques for three-dimensional reconstruction".

Company Profile

2.4.12

VYSTAVEL; Tomas - Brno CZ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Data Acquisition and Processing Techniques for Three-Dimensional Reconstruction App 20220208508 - KAPLENKO; Oleksii ; et al.	2022-06-30
Method And System For Wafer Defect Inspection App 20220113262 - Alvis; Roger ; et al.	2022-04-14
Method Of Examining A Sample Using A Charged Particle Beam Apparatus App 20220065804 - Kaplenko; Oleksii ; et al.	2022-03-03
Method For Diffraction Pattern Acquisitionmethod For Diffraction Pattern Acquisition App 20210404978 - Vystavel; Tomas ; et al.	2021-12-30
Measurement and endpointing of sample thickness Grant 10,978,272 - Vystavel , et al. April 13, 2	2021-04-13
Measurement And Endpointing Of Sample Thickness App 20200135427 - Vystavel; Tomas ; et al.	2020-04-30
Method For Sample Orientation For Tem Lamella Preparation App 20190198287 - Vystavel; Tomas ; et al.	2019-06-27
Method of modifying a sample surface layer from a microscopic sample Grant 10,105,734 - Vystavel , et al. October 23, 2	2018-10-23
Arrangement For X-ray Tomography App 20180100815 - Stejskal; Pavel ; et al.	2018-04-12
Reinforced sample for transmission electron microscope Grant 9,837,246 - Geurts , et al. December 5, 2	2017-12-05
Specimen holder for a charged particle microscope Grant 9,741,527 - Vystavel , et al. August 22, 2	2017-08-22
Method Of Manipulating A Sample In An Evacuated Chamber Of A Charged Particle Apparatus App 20160307727 - Vystavel; Tomas ; et al.	2016-10-20
Method Of Modifying A Sample Surface Layer From A Microscopic Sample App 20160199878 - Vystavel; Tomas ; et al.	2016-07-14
Specimen Holder For A Charged Particle Microscope App 20160181059 - Vystavel; Tomas ; et al.	2016-06-23
Method Of Acquiring Ebsp Patterns App 20160054240 - Uncovsk ; Marek ; et al.	2016-02-25
Method of Sampling a Sample and Displaying Obtained Information App 20140146160 - Potocek; Pavel ; et al.	2014-05-29

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