Vranken; Hendrikus Petrus Elisabeth
Patent Applications and Registrations
Patent applications and USPTO patent grants for Vranken; Hendrikus Petrus Elisabeth.The latest application filed is for "testing of an integrated circuit that contains secret information".
- Vranken; Hendrikus Petrus Elisabeth - Weert NL
- Vranken; Hendrikus Petrus Elisabeth - Eindhoven NL
| Patent | Date |
|---|---|
| Integrated circuit test method and test apparatus Grant 8,281,197 - Vranken October 2, 2 | 2012-10-02 |
| Integrated circuit arrangement and design method Grant 7,945,828 - Vranken May 17, 2 | 2011-05-17 |
| Testing Of An Integrated Circuit That Contains Secret Information App 20100264932 - Marinissen; Erik Jan ; et al. | 2010-10-21 |
| Testing Of An Integrated Circuit That Contains Secret Information App 20100223515 - Nieuwland; Andre Krijn ; et al. | 2010-09-02 |
| Methods and apparatus for data compression Grant 7,558,994 - Vranken , et al. July 7, 2 | 2009-07-07 |
| Integrated Circuit Test Method And Test Apparatus App 20090077439 - Vranken; Hendrikus Petrus Elisabeth | 2009-03-19 |
| Integrated Circuit Arrangement And Design Method App 20090024893 - Vranken; Hendrikus Petrus Elisabeth | 2009-01-22 |
| Method and system for selectively masking test responses Grant 7,376,873 - Vranken , et al. May 20, 2 | 2008-05-20 |
| Data processor and method for using a data processor with debug circuit Grant 7,293,258 - Vranken , et al. November 6, 2 | 2007-11-06 |
| Method and system for selectively masking test responses App 20070067688 - Vranken; Hendrikus Petrus Elisabeth ; et al. | 2007-03-22 |
| Data compression App 20070011514 - Vranken; Hendrikus Petrus Elisabeth ; et al. | 2007-01-11 |
| Low pin count, high-speed boundary scan testing Grant 7,124,340 - Bos , et al. October 17, 2 | 2006-10-17 |
| Method for testing a testable electronic device App 20030041296 - Bos, Gerardus Arnoldus Antonius ; et al. | 2003-02-27 |
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