Volf; Boris
Patent Applications and Registrations
Patent applications and USPTO patent grants for Volf; Boris.The latest application filed is for "large area nanopatterning method and apparatus".
- Volf; Boris - Hillsborough NJ US
- Volf; Boris - Hightstown NJ
- Volf; Boris - Plainsboro NJ
| Patent | Date |
|---|---|
| Enhanced wafer carrier Grant 8,535,445 - Volf , et al. September 17, 2 | 2013-09-17 |
| Large area nanopatterning method and apparatus Grant 8,518,633 - Kobrin , et al. August 27, 2 | 2013-08-27 |
| Large Area Nanopatterning Method And Apparatus App 20130208251 - Kobrin; Boris ; et al. | 2013-08-15 |
| Wafer Carrier With Thermal Features App 20130065403 - Paranjpe; Ajit ; et al. | 2013-03-14 |
| Wafer Carrier With Selective Control Of Emissivity App 20120171377 - Volf; Boris ; et al. | 2012-07-05 |
| Heater With Liquid Heating Element App 20120073502 - Volf; Boris ; et al. | 2012-03-29 |
| Enhanced Wafer Carrier App 20120040097 - Volf; Boris ; et al. | 2012-02-16 |
| Wafer Carrier With Varying Thermal Resistance App 20100055318 - Volf; Boris ; et al. | 2010-03-04 |
| Method and apparatus for measuring the curvature of reflective surfaces Grant 7,570,368 - Belousov , et al. August 4, 2 | 2009-08-04 |
| Calibration wafer and method of calibrating in situ temperatures Grant 7,452,125 - Volf , et al. November 18, 2 | 2008-11-18 |
| Calibration wafer and method of calibrating in situ temperatures App 20070291816 - Volf; Boris ; et al. | 2007-12-20 |
| Calibration wafer and method of calibrating in situ temperatures Grant 7,275,861 - Volf , et al. October 2, 2 | 2007-10-02 |
| Calibration wafer and method of calibrating in situ temperatures App 20060171442 - Volf; Boris ; et al. | 2006-08-03 |
| Method and apparatus for measuring the curvature of reflective surfaces App 20050286058 - Belousov, Mikhail ; et al. | 2005-12-29 |
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