Vodanovic; Bojko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vodanovic; Bojko.The latest application filed is for "wafer flattening apparatus and method".

Company Profile

0.9.5

Vodanovic; Bojko - Baie d'Urfe CA
Vodanovic; Bojko - Beaconsfield Quebec CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wafer flattening apparatus and method Grant 8,695,990 - Vodanovic , et al. April 15, 2	2014-04-15
Method and apparatus for scanning substrates Grant 8,144,968 - Vodanovic March 27, 2	2012-03-27
Wafer Flattening Apparatus And Method App 20110241298 - VODANOVIC; Bojko ; et al.	2011-10-06
Method And Apparatus For Scanning Substrates App 20100177951 - Vodanovic; Bojko	2010-07-15
Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object Grant 7,551,272 - Vodanovic June 23, 2	2009-06-23
Method and system for the inspection of integrated circuit devices having leads Grant 7,535,560 - Vodanovic May 19, 2	2009-05-19
Method And System For The Inspection Of Integrated Circuit Devices Having Leads App 20080204732 - VODANOVIC; Bojko	2008-08-28
Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object App 20070103675 - Vodanovic; Bojko	2007-05-10
Absolute position determination for a CCD-based acquisition unit Grant 7,012,631 - Vodanovic March 14, 2	2006-03-14
CCD imaging device and method for high speed profiling Grant 6,885,400 - Vodanovic April 26, 2	2005-04-26
Absolute position determination for a CCD-based acquisition unit App 20040051810 - Vodanovic, Bojko	2004-03-18
QFP lead quality inspection system and method Grant 5,406,372 - Vodanovic , et al. April 11, 1	1995-04-11

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