Vistec Semiconductor Systems Jena GmbH

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vistec Semiconductor Systems Jena GmbH.The latest application filed is for "apparatus and method for the determination of the position of a disk-shaped object".

Company Profile

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Vistec Semiconductor Systems Jena GmbH - Jena DE
VISTEC SEMICONDUCTOR SYSTEMS JENA GmbH -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Device and method for automatic detection of incorrect measurements by means of quality factors Grant 8,154,595 - Boesser , et al. April 10, 2	2012-04-10
Apparatus and method for the determination of the position of a disk-shaped object Grant 8,125,653 - Weniger , et al. February 28, 2	2012-02-28
Apparatus And Method For The Determination Of The Position Of A Disk-shaped Object App 20100085582 - Weniger; Gert ; et al.	2010-04-08
Device for holding disk-shaped objects App 20090309285 - Schenck; Rene ; et al.	2009-12-17
Method for calculating a model spectrum Grant 7,561,984 - Halm July 14, 2	2009-07-14
System for inspecting a disk-shaped object Grant 7,426,024 - Hiltawski, legal representative , et al. Septemb	2008-09-16
Apparatus for holding disk-like objects App 20080203636 - Schenck; Rene ; et al.	2008-08-28
Device And Method For Automatic Detection Of Incorrect Measurements By Means Of Quality Factors App 20080202201 - Boesser; Hans-Artur ; et al.	2008-08-28
Apparatus and method for thin-layer metrology Grant 7,349,106 - Slodowski March 25, 2	2008-03-25
Measurement system with an optical measurement arrangement Grant 7,277,190 - Slodowski , et al. October 2, 2	2007-10-02
Method for matching a model spectrum to a measured spectrum App 20070174014 - Halm; Christian	2007-07-26
Method for calculating a model spectrum App 20070171429 - Halm; Christian	2007-07-26
Method and apparatus for inspecting a wafer App 20070076943 - Wienecke; Joachim ; et al.	2007-04-05
Arrangement and method for inspecting unpatterned wafers Grant 7,084,965 - Wienecke , et al. August 1, 2	2006-08-01

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