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Laser-assisted device alteration using synchronized laser pulses Grant 11,353,479 - Vedagarbha , et al. June 7, 2 | 2022-06-07 |
Laser-assisted Device Alteration Using Synchronized Laser Pulses App 20200025799 - Vedagarbha; Praveen ;   et al. | 2020-01-23 |
Laser-assisted device alteration using synchronized laser pulses Grant 10,209,274 - Vedagarbha , et al. Feb | 2019-02-19 |
Systems and method for laser voltage imaging Grant 10,126,360 - Vickers November 13, 2 | 2018-11-13 |
Laser-assisted Device Alteration Using Synchronized Laser Pulses App 20160202313 - Vedagarbha; Praveen ;   et al. | 2016-07-14 |
Apparatus and method for polarization diversity imaging and alignment Grant 9,361,533 - Serrels , et al. June 7, 2 | 2016-06-07 |
Systems And Method For Laser Voltage Imaging App 20160109513 - Vickers; James S. | 2016-04-21 |
Integrated Photodiode For Semiconductor Substrates App 20160104812 - Steinbrueck; Gary ;   et al. | 2016-04-14 |
Laser-assisted device alteration using synchronized laser pulses Grant 9,201,096 - Vedagarbha , et al. December 1, 2 | 2015-12-01 |
Integrated photodiode for semiconductor substrates Grant 8,872,297 - Steinbrueck , et al. October 28, 2 | 2014-10-28 |
Integrated Photodiode For Semiconductor Substrates App 20130334644 - Steinbrueck; Gary ;   et al. | 2013-12-19 |
Laser-assisted Device Alteration Using Synchronized Laser Pulses App 20130314116 - Vedagarbha; Praveen ;   et al. | 2013-11-28 |
Apparatus And Method For Polarization Diversity Imaging And Alignment App 20130121617 - Serrels; Keith ;   et al. | 2013-05-16 |
Integrated photodiode for semiconductor substrates Grant 8,410,568 - Steinbrueck , et al. April 2, 2 | 2013-04-02 |
Test structures for evaluating a fabrication of a die or a wafer Grant 8,344,745 - Aghababazadeh , et al. January 1, 2 | 2013-01-01 |
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,736,916 - Aghababazadeh , et al. June 15, 2 | 2010-06-15 |
System for using test structures to evaluate a fabrication of a wafer Grant 7,723,724 - Aghababazadeh , et al. May 25, 2 | 2010-05-25 |
Integrated Photodiode For Semiconductor Substrates App 20100084729 - Steinbrueck; Gary ;   et al. | 2010-04-08 |
Intra-chip power and test signal generation for use with test structures on wafers Grant 7,605,597 - Aghababazadeh , et al. October 20, 2 | 2009-10-20 |
Bi-convex solid immersion lens Grant 7,492,529 - Pakdaman , et al. February 17, 2 | 2009-02-17 |
Technique For Evaluating A Fabrication Of A Die And Wafer App 20080315196 - AGHABABAZADEH; Majid ;   et al. | 2008-12-25 |
Technique for evaluating a fabrication of a die and wafer Grant 7,423,288 - Aghababazadeh , et al. September 9, 2 | 2008-09-09 |
Intra-chip Power And Test Signal Generation For Use With Test Structures On Wafers App 20080100319 - Aghababazadeh; Majid ;   et al. | 2008-05-01 |
Intra-clip power and test signal generation for use with test structures on wafers Grant 7,339,388 - Aghababazadeh , et al. March 4, 2 | 2008-03-04 |
System And Apparatus For Using Test Structures Inside Of A Chip During The Fabrication Of The Chip App 20070238206 - Aghababazadeh; Majid ;   et al. | 2007-10-11 |
System And Apparatus For Using Test Structures Inside Of A Chip During The Fabrication Of The Chip App 20070236232 - Aghababazadeh; Majid ;   et al. | 2007-10-11 |
Bi-convex Solid Immersion Lens App 20070205795 - PAKDAMAN; Nader ;   et al. | 2007-09-06 |
Technique For Evaluating A Fabrication Of A Die And Wafer App 20070187679 - Aghababazadeh; Majid ;   et al. | 2007-08-16 |
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,256,055 - Aghababazadeh , et al. August 14, 2 | 2007-08-14 |
Bi-convex solid immersion lens Grant 7,227,702 - Pakdaman , et al. June 5, 2 | 2007-06-05 |
Technique for evaluating a fabrication of a die and wafer Grant 7,220,990 - Aghababazadeh , et al. May 22, 2 | 2007-05-22 |
Technique For Evaluating A Fabrication Of A Die And Wafer App 20070004063 - Aghababazadeh; Majid ;   et al. | 2007-01-04 |
Lens mount integrated with a thermoelectrically cooled photodetector module Grant 7,009,173 - Ispasoiu , et al. March 7, 2 | 2006-03-07 |
Lens mount integrated with a thermoelectrically cooled photodetector module App 20050279923 - Ispasoiu, Radu ;   et al. | 2005-12-22 |
System and apparatus for using test structures inside of a chip during the fabrication of the chip App 20050090027 - Aghababazadeh, Majid ;   et al. | 2005-04-28 |
Intra-chip power and test signal generation for use with test structures on wafers App 20050090916 - Aghababazadeh, Majid ;   et al. | 2005-04-28 |
Technique for evaluating a fabrication of a die and wafer App 20050085032 - Aghababazadeh, Majid ;   et al. | 2005-04-21 |
Bi-convex solid immersion lens App 20040240074 - Pakdaman, Nader ;   et al. | 2004-12-02 |
Avalanche photodiode for photon counting applications and method thereof Grant 6,797,581 - Vickers September 28, 2 | 2004-09-28 |
Bi-convex solid immersion lens Grant 6,778,327 - Pakdaman , et al. August 17, 2 | 2004-08-17 |
Avalanche photodiode for photon counting applications and method thereof App 20040106265 - Vickers, James S. | 2004-06-03 |
Avalanche photodiode for photon counting applications and method thereof Grant 6,720,588 - Vickers April 13, 2 | 2004-04-13 |
Bi-convex solid immersion lens App 20030202255 - Pakdaman, Nader ;   et al. | 2003-10-30 |
Bi-convex solid immersion lens Grant 6,594,086 - Pakdaman , et al. July 15, 2 | 2003-07-15 |
Avalanche photodiode for photon counting applications and method thereof App 20030098463 - Vickers, James S. | 2003-05-29 |