Vertikov; Andrey

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vertikov; Andrey.The latest application filed is for "temperature profile mapping and guided thermotherapy".

Company Profile

0.9.7

Vertikov; Andrey - Westwood MA
Vertikov; Andrey - Lake Hiawatha NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Temperature profile mapping and guided thermotherapy Grant 9,247,991 - Norris , et al. February 2, 2	2016-02-02
Delivering light via optical waveguide and multi-view optical probe head Grant 8,666,209 - Wang , et al. March 4, 2	2014-03-04
Temperature Profile Mapping And Guided Thermotherapy App 20130261613 - Norris; Peter E. ; et al.	2013-10-03
Temperature profile mapping and guided thermotherapy Grant 8,452,383 - Norris , et al. May 28, 2	2013-05-28
Threshold determination in an inspection system Grant 8,260,035 - Tek , et al. September 4, 2	2012-09-04
Delivering Light Via Optical Waveguide And Multi-view Optical Probe Head App 20120033911 - Wang; Feiling ; et al.	2012-02-09
Delivering light via optical waveguide and multi-view optical probe head Grant 8,041,162 - Wang , et al. October 18, 2	2011-10-18
Temperature Profile Mapping And Guided Thermotherapy App 20110066035 - Norris; Peter E. ; et al.	2011-03-17
Delivering Light Via Optical Waveguide and Multi-View Optical Probe Head App 20100201985 - Wang; Feiling ; et al.	2010-08-12
Delivering light via optical waveguide and multi-view optical probe head Grant 7,706,646 - Wang , et al. April 27, 2	2010-04-27
Delivering light via optical waveguide and multi-view optical probe head App 20080267562 - Wang; Feiling ; et al.	2008-10-30
System and method for defect detection threshold determination in an workpiece surface inspection system App 20080075353 - Tek; Mehmet ; et al.	2008-03-27
Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system Grant 6,504,618 - Morath , et al. January 7, 2	2003-01-07
Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system App 20020135784 - Morath, Christopher ; et al.	2002-09-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.