Verstraeten; Bert

Patent Applications and Registrations

Patent applications and USPTO patent grants for Verstraeten; Bert.The latest application filed is for "method for process metrology".

Company Profile

2.6.7

Verstraeten; Bert - Lommel BE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for process metrology Grant 11,385,551 - Verstraeten , et al. July 12, 2	2022-07-12
Method For Process Metrology App 20210302845 - VERSTRAETEN; Bert ; et al.	2021-09-30
Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing method Grant 11,054,754 - Staals , et al. July 6, 2	2021-07-06
Substrate, metrology apparatus and associated methods for a lithographic process Grant 10,871,367 - Verma , et al. December 22, 2	2020-12-22
Substrate, Metrology Apparatus And Associated Methods For A Lithographic Process App 20200284578 - VERMA; Alok ; et al.	2020-09-10
Method of measuring a parameter of a device manufacturing process, metrology apparatus, substrate, target, device manufacturing system, and device manufacturing method Grant 10,747,122 - Tsiatmas , et al. A	2020-08-18
Substrate, metrology apparatus and associated methods for a lithographic process Grant 10,677,589 - Verma , et al.	2020-06-09
Methods and Patterning Devices and Apparatuses for Measuring Focus Performance of a Lithographic Apparatus, Device Manufacturing App 20200142324 - STAALS; Frank ; et al.	2020-05-07
Method of determining an optimal focus height for a metrology apparatus Grant 10,571,363 - Medvedyeva , et al. Feb	2020-02-25
Method Of Measuring A Parameter Of A Device Manufacturing Process, Metrology Apparatus, Substrate, Target, Device Manufacturing App 20190354024 - TSIATMAS; Anagnostis ; et al.	2019-11-21
Method Of Determining An Optimal Focus Height For A Metrology Apparatus App 20190242782 - MEDVEDYEVA; Mariya Vyacheslavivna ; et al.	2019-08-08
Method Of Processing Data, Method Of Obtaining Calibration Data App 20190204180 - MEDVEDYEVA; Mariya Vyacheslavivna ; et al.	2019-07-04
Substrate, Metrology Apparatus And Associated Methods For A Lithographic Process App 20190063911 - Verma; Alok ; et al.	2019-02-28

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