Verstappen; Leonardus Henricus Marie

Patent Applications and Registrations

Patent applications and USPTO patent grants for Verstappen; Leonardus Henricus Marie.The latest application filed is for "methods and apparatus for measuring a property of a substrate".

Company Profile

4.14.12

Verstappen; Leonardus Henricus Marie - Weert NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and Apparatus for Measuring a Property of a Substrate App 20210215622 - Elings; Wouter Lodewijk ; et al.	2021-07-15
Methods and apparatus for measuring a property of a substrate Grant 10,996,176 - Elings , et al. May 4, 2	2021-05-04
Methods and apparatus for measuring a property of a substrate Grant 10,746,668 - Elings , et al. A	2020-08-18
Methods and Apparatus for Measuring a Property of a Substrate App 20190301850 - ELINGS; Wouter Lodewijk ; et al.	2019-10-03
Methods and apparatus for measuring a property of a substrate Grant 10,317,191 - Elings , et al.	2019-06-11
Lithographic apparatus for measuring overlay error and a device manufacturing method Grant 9,798,250 - Van De Kerkhof , et al. October 24, 2	2017-10-24
Methods and Apparatus for Measuring a Property of a Substrate App 20170160073 - ELINGS; Wouter Lodewijk ; et al.	2017-06-08
Methods and apparatus for measuring a property of a substrate Grant 9,594,029 - Elings , et al. March 14, 2	2017-03-14
Lithographic Apparatus for Measuring Overlay Error and a Device Manufacturing Method App 20160377992 - VAN DE KERKHOF; Marcus Adrianus ; et al.	2016-12-29
Method of Measuring Overlay Error and a Device Manufacturing Method App 20160018742 - VAN DE KERKHOF; Marcus Adrianus ; et al.	2016-01-21
Method of measuring overlay error and a device manufacturing method Grant 9,201,310 - Van De Kerkhof , et al. December 1, 2	2015-12-01
Methods and Apparatus for Measuring A Property of a Substrate App 20140354969 - Elings; Wouter Lodewijk ; et al.	2014-12-04
Inspection method and apparatus Grant 8,749,775 - Verstappen , et al. June 10, 2	2014-06-10
Inspection apparatus for lithography Grant 8,724,087 - Van De Kerkhof , et al. May 13, 2	2014-05-13
Method of Measuring Overlay Error and a Device Manufacturing Method App 20110200246 - Van De Kerkhof; Marcus Adrianus ; et al.	2011-08-18
Inspection Apparatus for Lithography App 20110141444 - Van De Kerkhof; Marcus Adrianus ; et al.	2011-06-16
Inspection Method and Apparatus App 20110085162 - VERSTAPPEN; Leonardus Henricus Marie ; et al.	2011-04-14
Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method Grant 7,630,087 - Verstappen , et al. December 8, 2	2009-12-08
Device manufacturing method and computer program product Grant 7,547,495 - Verstappen , et al. June 16, 2	2009-06-16
Method of selecting a grid model for correcting a process recipe for grid deformations in a lithographic apparatus and lithographic assembly using the same Grant 7,468,795 - Simons , et al. December 23, 2	2008-12-23
Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method App 20080117434 - Verstappen; Leonardus Henricus, Marie ; et al.	2008-05-22
Device manufacturing method and computer program product App 20070141486 - Verstappen; Leonardus Henricus Marie ; et al.	2007-06-21
Modification of an image of a pattern during an imaging process App 20050210438 - Verstappen, Leonardus Henricus Marie ; et al.	2005-09-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.