Verkuil; Roger Leonard
Patent Applications and Registrations
Patent applications and USPTO patent grants for Verkuil; Roger Leonard.The latest application filed is for "probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer".
- Verkuil; Roger Leonard - Wappingers Falls NY
- Verkuil; Roger Leonard - Wappinger Falls NY
- Verkuil; Roger Leonard - Poughkeepsie NY
| Patent | Date |
|---|---|
| Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer Grant 5,767,691 - Verkuil June 16, 1 | 1998-06-16 |
| Photovoltaic oxide charge measurement probe technique Grant 5,650,731 - Fung , et al. July 22, 1 | 1997-07-22 |
| Uniform density charge deposit source Grant 5,644,223 - Verkuil July 1, 1 | 1997-07-01 |
| Contactless LSI junction leakage testing method Grant 4,015,203 - Verkuil March 29, 1 | 1977-03-29 |
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