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Patent applications and USPTO patent grants for Verheijen; Martin.The latest application filed is for "method of imaging a sample using an electron microscope".
Patent | Date |
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Method of imaging a sample using an electron microscope Grant 10,937,625 - Franken , et al. March 2, 2 | 2021-03-02 |
Method Of Imaging A Sample Using An Electron Microscope App 20200168433 - Franken; Erik Michiel ;   et al. | 2020-05-28 |
Method of calibrating a scanning transmission charged-particle microscope Grant 9,396,907 - Otten , et al. July 19, 2 | 2016-07-19 |
Method Of Calibrating A Scanning Transmission Charged-particle Microscope App 20160013016 - Otten; Maximus Theodorus ;   et al. | 2016-01-14 |
Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus Grant 8,757,873 - van den Boom , et al. June 24, 2 | 2014-06-24 |
Method of Measuring the Temperature of a Sample Carrier in a Charged Particle-Optical Apparatus App 20120128028 - van den Boom; Stephanus Hubertus Leonardus ;   et al. | 2012-05-24 |
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