Vereschagin; Vadim

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vereschagin; Vadim.The latest application filed is for "determining a critical dimension variation of a pattern".

Company Profile

4.3.7

Vereschagin; Vadim - Hod-HaSharon IL
Vereschagin; Vadim - Haifa IL
VERESCHAGIN; Vadim - Ashdod IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Determining A Critical Dimension Variation Of A Pattern App 20220198639 - Vereschagin; Vadim ; et al.	2022-06-23
System, method and computer program product for analyzing jpeg images for forensic and other purposes Grant 11,315,230 - Atzmon , et al. April 26, 2	2022-04-26
Determining a critical dimension variation of a pattern Grant 11,276,160 - Vereschagin , et al. March 15, 2	2022-03-15
Method, System And Computer Program Product For 3d-nand Cdsem Metrology App 20210383529 - KRIS; Roman ; et al.	2021-12-09
System, Method And Computer Program Product For Analyzing Jpeg Images For Forensic And Other Purposes App 20210065355 - ATZMON; Ron ; et al.	2021-03-04
Evaluating An Intermediate Product Related To A Three-dimensional Nand Memory Unit App 20210066026 - Kris; Roman ; et al.	2021-03-04
System, method and computer program product for analyzing JPEG images for forensic and other purposes Grant 10,810,722 - Atzmon , et al. October 20, 2	2020-10-20
Determining A Critical Dimension Variation Of A Pattern App 20200327652 - VERESCHAGIN; Vadim ; et al.	2020-10-15
System, Method And Computer Program Product For Analyzing Jpeg Images For Forensic And Other Purposes App 20190019282 - ATZMON; Ron ; et al.	2019-01-17

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