Verburgt; Thomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Verburgt; Thomas.The latest application filed is for "automated wafer defect inspection system and a process of performing such inspection".

Company Profile

0.7.4

Verburgt; Thomas - Eden Prairie MN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Automated wafer defect inspection system and a process of performing such inspection Grant 9,464,992 - O'Dell , et al. October 11, 2	2016-10-11
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection App 20160223470 - O'Dell; Jeffrey L. ; et al.	2016-08-04
Automated wafer defect inspection system and a process of performing such inspection Grant 9,337,071 - O'Dell , et al. May 10, 2	2016-05-10
Automated Wafer Defect Inspection System And A Process Of Performing Such Inspection App 20120087569 - O'Dell; Jeffrey ; et al.	2012-04-12
Automated Wafer Defect Inspection System And A Process Of Performing Such Inspection App 20100239157 - O'Dell; Jeffrey ; et al.	2010-09-23
Automated wafer defect inspection system and a process of performing such inspection Grant 7,729,528 - O'Dell , et al. June 1, 2	2010-06-01
Automated wafer defect inspection system and a process of performing such inspection Grant 6,937,753 - O'Dell , et al. August 30, 2	2005-08-30
Automated wafer defect inspection system and a process of performing such inspection App 20050008218 - O'Dell, Jeffrey ; et al.	2005-01-13
Automated wafer defect inspection system and a process of performing such inspection Grant 6,826,298 - O'Dell , et al. November 30, 2	2004-11-30
Automated wafer defect inspection system and a process of performing such inspection Grant 6,324,298 - O'Dell , et al. November 27, 2	2001-11-27

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