Venkataraman; Sankar

Patent Applications and Registrations

Patent applications and USPTO patent grants for Venkataraman; Sankar.The latest application filed is for "interpretable deep learning-based defect detection and classification".

Company Profile

8.14.15

Venkataraman; Sankar - Milpitas CA
Venkataraman; Sankar - San Jose CA
Venkataraman; Sankar - Honolulu HI

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Interpretable Deep Learning-based Defect Detection And Classification App 20220101114 - Zhang; Xu ; et al.	2022-03-31
Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundaries Grant 11,237,872 - Gupta , et al. February 1, 2	2022-02-01
Training a machine learning model with synthetic images Grant 11,170,255 - Riley , et al. November 9, 2	2021-11-09
Semi-supervised anomaly detection in scanning electron microscope images Grant 10,789,703 - Lu , et al. September 29, 2	2020-09-29
Unified neural network for defect detection and classification Grant 10,607,119 - He , et al.	2020-03-31
Method and system for defect classification Grant 10,482,590 - He , et al. Nov	2019-11-19
Training A Machine Learning Model With Synthetic Images App 20190294923 - Riley; Ian ; et al.	2019-09-26
Semi-supervised Anomaly Detection In Scanning Electron Microscope Images App 20190287230 - Lu; Shaoyu ; et al.	2019-09-19
Contour based defect detection Grant 10,395,362 - Gupta , et al. A	2019-08-27
Unified Neural Network For Defect Detection And Classification App 20190073568 - He; Li ; et al.	2019-03-07
Single image detection Grant 10,186,026 - Karsenti , et al. Ja	2019-01-22
Scalable and Flexible Job Distribution Architecture for a Hybrid Processor System to Serve High Bandwidth Real Time Computational Systems Used in Semiconductor Inspection and Metrology Systems App 20180341525 - Gupta; Ajay ; et al.	2018-11-29
Contour Based Defect Detection App 20180293721 - Gupta; Ajay ; et al.	2018-10-11
Method and System for Defect Classification App 20180114310 - He; Li ; et al.	2018-04-26
Method and system for iterative defect classification Grant 9,922,269 - Venkataraman , et al. March 20, 2	2018-03-20
Method and system for defect classification Grant 9,898,811 - He , et al. February 20, 2	2018-02-20
Adaptive nuisance filter Grant 9,835,566 - Liang , et al. December 5, 2	2017-12-05
Accelerated Training Of A Machine Learning Based Model For Semiconductor Applications App 20170193400 - Bhaskar; Kris ; et al.	2017-07-06
Single Image Detection App 20170140524 - Karsenti; Laurent ; et al.	2017-05-18
Method and System for Iterative Defect Classification App 20160358041 - Venkataraman; Sankar ; et al.	2016-12-08
Method and System for Defect Classification App 20160328837 - He; Li ; et al.	2016-11-10
Adaptive Nuisance Filter App 20160258879 - Liang; Ardis ; et al.	2016-09-08
Contour-based defect detection using an inspection apparatus Grant 8,669,523 - Chen , et al. March 11, 2	2014-03-11
Methods of contrast enhancement for images having blood vessel structures Grant 8,351,667 - Li , et al. January 8, 2	2013-01-08
Contour-based Defect Detection Using An Inspection Apparatus App 20120298862 - CHEN; Chien-Huei ; et al.	2012-11-29
Methods for detection and characterization of atypical vessels in cervical imagery Grant 8,090,177 - Venkataraman , et al. January 3, 2	2012-01-03
Methods for enhancing vascular patterns in cervical imagery App 20100040263 - Li; Wenjing ; et al.	2010-02-18
Methods for detection and characterization of atypical vessels in cervical imagery App 20100027863 - Venkataraman; Sankar ; et al.	2010-02-04

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