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Veneklasen; Lee Patent Filings

Veneklasen; Lee

Patent Applications and Registrations

Patent applications and USPTO patent grants for Veneklasen; Lee.The latest application filed is for "apparatus and methods for secondary electron emission microscope with dual beam".

Company Profile
0.7.4
  • Veneklasen; Lee - Castro Valley CA
  • Veneklasen; Lee - late of Castro Valley CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus and methods for secondary electron emission microscope with dual beam
Grant 6,803,572 - Veneklasen , et al. October 12, 2
2004-10-12
Real-time prediction of and correction of proximity resist heating in raster scan particle beam lithography
Grant 6,720,565 - Innes , et al. April 13, 2
2004-04-13
Apparatus and methods for secondary electron emission microscope with dual beam
App 20040000642 - Veneklasen, Lee ;   et al.
2004-01-01
Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams
Grant 6,610,980 - Veneklasen , et al. August 26, 2
2003-08-26
Apparatus and methods for secondary electron emission microscope with dual beam
Grant 6,586,733 - Veneklasen , et al. July 1, 2
2003-07-01
Real-time prediction of and correction of proximity resist heating in raster scan particle beam lithography
App 20020148978 - Innes, Robert ;   et al.
2002-10-17
Electron beam apparatus having traversing circuit boards
App 20020134912 - Veneklasen, Lee ;   et al.
2002-09-26
Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams
App 20020070340 - Veneklasen, Lee ;   et al.
2002-06-13
Real-time prediction of proximity resist heating and correction of raster scan electron beam lithography
Grant 6,373,071 - Innes , et al. April 16, 2
2002-04-16
Electron beam inspection system and method
Grant 5,502,306 - Meisburger , et al. March 26, 1
1996-03-26
Specimen distance measuring system
Grant 4,788,431 - Eckes , et al. November 29, 1
1988-11-29

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