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name:-0.0041041374206543
name:-0.0029098987579346
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Vella; Eric N. Patent Filings

Vella; Eric N.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vella; Eric N..The latest application filed is for "apparatus and methods for optically inspecting a sample for anomalies".

Company Profile
0.4.3
  • Vella; Eric N. - Mountain View CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus and methods for optically inspecting a sample for anomalies
Grant 7,012,683 - Wolf , et al. March 14, 2
2006-03-14
Apparatus and methods for optically inspecting a sample for anomalies
App 20050092899 - Wolf, Ralph C. ;   et al.
2005-05-05
Apparatus and methods for optically inspecting a sample for anomalies
Grant 6,833,913 - Wolf , et al. December 21, 2
2004-12-21
UV compatible programmable spatial filter
Grant 6,686,994 - Wilk , et al. February 3, 2
2004-02-03
Two-dimensional UV compatible programmable spatial filter
Grant 6,686,995 - Wilk , et al. February 3, 2
2004-02-03
Two-dimensional Uv Compatible Programmable Spatial Filter
App 20040001198 - Wilk, Dieter E. ;   et al.
2004-01-01
UV compatible programmable spatial filter
App 20030184739 - Wilk, Dieter E. ;   et al.
2003-10-02

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