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Patent applications and USPTO patent grants for Vella; Eric.The latest application filed is for "correcting aberration and apodization of an optical system using correction plates".
Patent | Date |
---|---|
Correcting Aberration And Apodization Of An Optical System Using Correction Plates App 20220244530 - Huang; Haifeng ;   et al. | 2022-08-04 |
Apparatus and methods for measuring phase and amplitude of light through a layer Grant 11,131,629 - Sezginer , et al. September 28, 2 | 2021-09-28 |
Apparatus And Methods For Measuring Phase And Amplitude Of Light Through A Layer App 20180340886 - Sezginer; Abdurrahman ;   et al. | 2018-11-29 |
Techniques and systems for model-based critical dimension measurements Grant 9,875,534 - Sezginer , et al. January 23, 2 | 2018-01-23 |
Techniques And Systems For Model-based Critical Dimension Measurements App 20170069080 - Sezginer; Abdurrahman ;   et al. | 2017-03-09 |
Systems and methods for scanning a beam of light across a specimen Grant 6,775,051 - Sullivan , et al. August 10, 2 | 2004-08-10 |
Systems and methods for scanning a beam of light across a specimen App 20020181119 - Sullivan, Jamie ;   et al. | 2002-12-05 |
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