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name:-0.0061402320861816
name:-0.0047898292541504
name:-0.00036191940307617
Vasek; James E. Patent Filings

Vasek; James E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vasek; James E..The latest application filed is for "method for protecting high-topography regions during patterning of low-topography regions".

Company Profile
0.4.5
  • Vasek; James E. - Austin TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Treatment for reduction of line edge roughness
Grant 7,670,760 - Shen , et al. March 2, 2
2010-03-02
Method For Protecting High-topography Regions During Patterning Of Low-topography Regions
App 20080085609 - Vasek; James E. ;   et al.
2008-04-10
Semiconductor device having trench isolation for differential stress and method therefor
Grant 7,288,447 - Chen , et al. October 30, 2
2007-10-30
Transistor structure with dual trench for optimized stress effect and method therefor
Grant 7,276,406 - Chen , et al. October 2, 2
2007-10-02
Treatment for reduction of line edge roughness
App 20070207404 - Shen; Jinmiao James ;   et al.
2007-09-06
Method of making a semiconductor device using treated photoresist
Grant 7,157,377 - Garza , et al. January 2, 2
2007-01-02
Semiconductor device having trench isolation for differential stress and method therefor
App 20060157783 - Chen; Jian ;   et al.
2006-07-20
Transistor structure with dual trench for optimized stress effect and method therefor
App 20060091461 - Chen; Jian ;   et al.
2006-05-04
Method of making a semiconductor device using treated photoresist
App 20050181630 - Garza, Cesar M. ;   et al.
2005-08-18

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