Vartuli; Catherine

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vartuli; Catherine.The latest application filed is for "apparatus and method for producing a <111> orientation aluminum film for an integrated circuit device".

Company Profile

0.12.8

Vartuli; Catherine - Windermere FL
Vartuli, Catherine - Savannah GA
Vartuli; Catherine - Orlando FL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for detecting defects in a material and a system for accomplishing the same Grant 6,870,950 - Houge , et al. March 22, 2	2005-03-22
Apparatus and method for producing a <111> orientation aluminum film for an integrated circuit device App 20040229477 - Daniel, Timothy J. ; et al.	2004-11-18
Calibration standard for high resolution electron microscopy Grant 6,750,447 - Houge , et al. June 15, 2	2004-06-15
Semiconductor manufacturing using modular substrates Grant 6,713,409 - Antonell , et al. March 30, 2	2004-03-30
Abnormal photoresist line/space profile detection through signal processing of metrology waveform Grant 6,708,574 - Houge , et al. March 23, 2	2004-03-23
Method and apparatus for minimizing semiconductor wafer contamination Grant 6,695,572 - Antonell , et al. February 24, 2	2004-02-24
Calibration standard for high resolution electron microscopy App 20030193022 - Houge, Erik Cho ; et al.	2003-10-16
Mass spectrometer particle counter Grant 6,633,032 - Houge , et al. October 14, 2	2003-10-14
Method of focused ion beam pattern transfer using a smart dynamic template Grant 6,627,885 - McIntosh , et al. September 30, 2	2003-09-30
X-ray system Grant 6,606,371 - Antonell , et al. August 12, 2	2003-08-12
Calibration method for quantitative elemental analysis Grant 6,603,119 - Giannuzzi , et al. August 5, 2	2003-08-05
Semiconductor manufacturing using modular substrates App 20030107117 - Antonell, Michael ; et al.	2003-06-12
Monitoring system for determining progress in a fabrication activity Grant 6,569,690 - Houge , et al. May 27, 2	2003-05-27
Method and apparatus for minimizing semiconductor wafer contamination App 20030063967 - Antonell, Michael ; et al.	2003-04-03
Calibration method for quantitative elemental analysis Grant 6,519,543 - Giannuzzi , et al. February 11, 2	2003-02-11
Method for detecting defects in a material and a system for accomplishing the same App 20020131631 - Houge, Erik C. ; et al.	2002-09-19
Method of determining a crystallographic quality of a material located on a substrate App 20020128789 - Houge, Erik C. ; et al.	2002-09-12
Mass spectrometer particle counter App 20020063201 - Houge, Erik Cho ; et al.	2002-05-30
Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced thereby Grant 6,362,475 - Bindell , et al. March 26, 2	2002-03-26
X-ray system App 20010043667 - Antonell, Michael ; et al.	2001-11-22

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