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Patent applications and USPTO patent grants for Vanneau; Emmanuel.The latest application filed is for "methods and devices for presenting a material stress analysis through captured ir images".
Patent | Date |
---|---|
Method and device for measurement with an IR imaging device Grant 8,933,403 - Vanneau January 13, 2 | 2015-01-13 |
Methods And Devices For Presenting A Material Stress Analysis Through Captured Ir Images App 20150002654 - Bremond; Pierre ;   et al. | 2015-01-01 |
Method And Device For Measurement With An Ir Imaging Device App 20120318984 - Vanneau; Emmanuel | 2012-12-20 |
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