Vandervorst; Wilfried

Patent Applications and Registrations

Patent applications and USPTO patent grants for Vandervorst; Wilfried.The latest application filed is for "method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample".

Company Profile

5.25.24

Vandervorst; Wilfried - Mechelen BE
Vandervorst; Wilfried - Leuven BE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and Apparatus for Aligning a Probe for Scanning Probe Microscopy to the Tip of a Pointed Sample App 20220065895 - Paredis; Kristof ; et al.	2022-03-03
Device for measuring surface characteristics of a material Grant 11,125,805 - Paredis , et al. September 21, 2	2021-09-21
Method for determining the shape of a sample tip for atom probe tomography Grant 10,746,759 - Paredis , et al. A	2020-08-18
Device For Measuring Surface Characteristics Of A Material App 20200033395 - Paredis; Kristof ; et al.	2020-01-30
Method and apparatus for transmission electron microscopy Grant 10,541,108 - Celano , et al. Ja	2020-01-21
Characterization Of Regions With Different Crystallinity In Materials App 20200006034 - Schulze; Andreas ; et al.	2020-01-02
Device and method for two dimensional active carrier profiling of semiconductor components Grant 10,495,666 - Paredis , et al. De	2019-12-03
Method For Determining The Shape Of A Sample Tip For Atom Probe Tomography App 20190277881 - Paredis; Kristof ; et al.	2019-09-12
Device And Method For Two Dimensional Active Carrier Profiling Of Semiconductor Components App 20190025341 - Paredis; Kristof ; et al.	2019-01-24
Method And Apparatus For Transmission Electron Microscopy App 20180240642 - Celano; Umberto ; et al.	2018-08-23
Method for differential heating of elongate nano-scaled structures Grant 10,014,178 - Vandervorst , et al. July 3, 2	2018-07-03
Method for Differential Heating of Elongate Nano-Scaled Structures App 20170178910 - Vandervorst; Wilfried ; et al.	2017-06-22
Probe configuration and method of fabrication thereof Grant 9,612,258 - Hantschel , et al. April 4, 2	2017-04-04
Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up Grant 9,588,137 - Eyben , et al. March 7, 2	2017-03-07
Apparatus And Method For Atomic Force Microscopy App 20150226766 - Paredis; Kristof ; et al.	2015-08-13
Probe Configuration And Method Of Fabrication Thereof App 20150185249 - HANTSCHEL; Thomas ; et al.	2015-07-02
Tunnel field-effect transistor and methods for manufacturing thereof Grant 8,872,230 - Verhulst , et al. October 28, 2	2014-10-28
Method for determining the active doping concentration of a doped semiconductor region Grant 8,717,570 - Bogdanowicz , et al. May 6, 2	2014-05-06
Method for Determining Local Resistivity and Carrier Concentration Using Scanning Spreading Resistance Measurement Set-Up App 20140068822 - Eyben; Pierre ; et al.	2014-03-06
Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof Grant 8,484,761 - Hantschel , et al. July 9, 2	2013-07-09
Tunnel Field-effect Transistor And Methods For Manufacturing Thereof App 20130161696 - Verhulst; Anne S. ; et al.	2013-06-27
Method For Determining The Active Doping Concentration Of A Doped Semiconductor Region App 20130155409 - BOGDANOWICZ; Janusz ; et al.	2013-06-20
Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructures Grant 8,232,517 - Verhulst , et al. July 31, 2	2012-07-31
Method for fabricating a high-K dielectric layer Grant 8,211,812 - Ragnarsson , et al. July 3, 2	2012-07-03
Laser Atom Probe and Laser Atom Probe Analysis Methods App 20120080596 - Vandervorst; Wilfried	2012-04-05
Method of Forming Mono-Crystalline Germanium or Silicon Germanium App 20110097881 - Vandervorst; Wilfried ; et al.	2011-04-28
Wavelength-sensitive Detector With Elongate Nanostructures App 20100171025 - Verhulst; Anne S. ; et al.	2010-07-08
Method For Cost-efficient Manufacturing Diamond Tips For Ultra-high Resolution Electrical Measurements And Devices Obtained Thereof App 20090313730 - Hantschel; Thomas ; et al.	2009-12-17
Wavelength-sensitive Detector With Elongate Nanostructures App 20090266974 - Verhulst; Anne ; et al.	2009-10-29
Wavelength-sensitive detector with elongate nanostructures Grant 7,598,482 - Verhulst , et al. October 6, 2	2009-10-06
Method For Fabricating A High-k Dielectric Layer App 20080265380 - Ragnarsson; Lars-Ake ; et al.	2008-10-30
System and method for measuring properties of a semiconductor substrate in a non-destructive way Grant 7,133,128 - Clarysse , et al. November 7, 2	2006-11-07
Method and apparatus for performing atomic force microscopy measurements Grant 6,823,723 - Vandervorst , et al. November 30, 2	2004-11-30
Method and apparatus for local surface analysis Grant 6,809,317 - Vandervorst October 26, 2	2004-10-26
Probe tip and method of manufacturing probe tips by peel-off Grant 6,756,584 - Hantschel , et al. June 29, 2	2004-06-29
System and method for measuring properties of a semiconductor substrate in a non-destructive way App 20040064263 - Clarysse, Trudo ; et al.	2004-04-01
Probe and method of manufacturing mounted AFM probes Grant 6,690,008 - Hantschel , et al. February 10, 2	2004-02-10
Method and apparatus for local surface analysis App 20030127591 - Vandervorst, Wilfried	2003-07-10
Probe tip configuration and a method of fabrication thereof Grant 6,504,152 - Hantschel , et al. January 7, 2	2003-01-07
Method and apparatus for performing atomic force microscopy measurements App 20020157457 - Vandervorst, Wilfried ; et al.	2002-10-31
Probe and method of manufacturing mounted AFM probes App 20020079445 - Hantschel, Thomas ; et al.	2002-06-27
Probe tip and method of manufacturing tips and probes for detecting microcurrent or microforce App 20020047091 - Hantschel, Thomas ; et al.	2002-04-25
Probe tip configuration and a method of fabrication thereof App 20020040884 - Hantschel, Thomas ; et al.	2002-04-11
Probe tip configuration and a method of fabrication thereof Grant 6,328,902 - Hantschel , et al. December 11, 2	2001-12-11
Method for measuring the electrical potential in a semiconductor element Grant 6,201,401 - Hellemans , et al. March 13, 2	2001-03-13
Method for measuring the electrical potential in a semiconductor element Grant 6,091,248 - Hellemans , et al. July 18, 2	2000-07-18
Database and method for measurement correction for cross-sectional carrier profiling techniques Grant 5,995,912 - DeWolf , et al. November 30, 1	1999-11-30
Method for measuring the electrical potential in a semiconductor element Grant 5,723,981 - Hellemans , et al. March 3, 1	1998-03-03

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