Vandervalk; Leon C.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Vandervalk; Leon C..The latest application filed is for "coating thickness gauge".
- Vandervalk; Leon C. - Brockville CA
- Vandervalk; Leon C. - Prescott CA
- Vandervalk; Leon C. - Ontario CA
- Vandervalk; Leon C. - Ogdensburg NY
| Patent | Date |
|---|---|
| Coating thickness gauge Grant RE41,342 - Koch , et al. May 18, 2 | 2010-05-18 |
| High resolution ultrasonic thickness gauge Grant 6,250,160 - Koch , et al. June 26, 2 | 2001-06-26 |
| Coating thickness gauge Grant 5,930,744 - Koch , et al. July 27, 1 | 1999-07-27 |
| Delay line for an ultrasonic probe and method of using same Grant 5,777,230 - Vandervalk July 7, 1 | 1998-07-07 |
| High resolution ultrasonic coating thickness gauge Grant 5,723,791 - Koch , et al. March 3, 1 | 1998-03-03 |
| Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil Grant RE35,703 - Koch , et al. December 30, 1 | 1997-12-30 |
| Gauge with reversible display screen Grant 5,686,831 - Vandervalk November 11, 1 | 1997-11-11 |
| Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil Grant 5,343,146 - Koch , et al. August 30, 1 | 1994-08-30 |
| Encryption apparatus for computer device Grant 5,325,430 - Smyth , et al. June 28, 1 | 1994-06-28 |
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