Van Wijnen; Paul Jacques

Patent Applications and Registrations

Patent applications and USPTO patent grants for Van Wijnen; Paul Jacques.The latest application filed is for "methods and apparatus for measuring a property of a substrate".

Company Profile

5.10.10

Van Wijnen; Paul Jacques - Veldhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and Apparatus for Measuring a Property of a Substrate App 20210215622 - Elings; Wouter Lodewijk ; et al.	2021-07-15
Methods and apparatus for measuring a property of a substrate Grant 10,996,176 - Elings , et al. May 4, 2	2021-05-04
Methods and Apparatus for Measuring a Property of a Substrate App 20200319118 - ELINGS; Wouter Lodewijk ; et al.	2020-10-08
Methods and apparatus for measuring a property of a substrate Grant 10,746,668 - Elings , et al. A	2020-08-18
Methods and Apparatus for Measuring a Property of a Substrate App 20190301850 - ELINGS; Wouter Lodewijk ; et al.	2019-10-03
Methods and apparatus for measuring a property of a substrate Grant 10,317,191 - Elings , et al.	2019-06-11
Methods and Apparatus for Measuring a Property of a Substrate App 20170160073 - ELINGS; Wouter Lodewijk ; et al.	2017-06-08
Methods and apparatus for measuring a property of a substrate Grant 9,594,029 - Elings , et al. March 14, 2	2017-03-14
Methods and Apparatus for Measuring A Property of a Substrate App 20140354969 - Elings; Wouter Lodewijk ; et al.	2014-12-04
Method of optimizing a die size, method of designing a pattern device manufacturing method, and computer program product Grant 8,642,235 - Veselinovic , et al. February 4, 2	2014-02-04
Method Of Optimizing A Die Size, Method Of Designing A Pattern Device Manufacturing Method, And Computer Program Product App 20120308921 - Veselinovic; Petar ; et al.	2012-12-06
Lithographic processing cell, lithographic apparatus, track and device manufacturing method Grant 7,679,715 - Kruijswijk , et al. March 16, 2	2010-03-16
Lithographic apparatus, combination of lithographic apparatus and processing module, and device manufacturing method Grant 7,679,714 - Onvlee , et al. March 16, 2	2010-03-16
Lithographic processing cell, lithographic apparatus, track and device manufacturing method App 20080266538 - Kruijswijk; Stefan Geerte ; et al.	2008-10-30
Lithographic processing cell, lithographic apparatus, track and device manufacturing method Grant 7,403,259 - Kruijswijk , et al. July 22, 2	2008-07-22
Lithographic apparatus, combination of lithographic apparatus and processing module, and device manufacturing method App 20080145791 - Onvlee; Johannes ; et al.	2008-06-19
Device inspection method and apparatus using an asymmetric marker Grant 7,112,813 - Den Boef , et al. September 26, 2	2006-09-26
Lithographic processing cell, lithographic apparatus, track and device manufacturing method App 20050206868 - Kruijswijk, Stefan Geerte ; et al.	2005-09-22
Device inspection App 20040129900 - Den Boef, Arie Jeffrey ; et al.	2004-07-08

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