van Veen; Gerard Nicolaas Anne

Patent Applications and Registrations

Patent applications and USPTO patent grants for van Veen; Gerard Nicolaas Anne.The latest application filed is for "multi-electron-beam imaging apparatus with improved performance".

Company Profile

3.13.10

van Veen; Gerard Nicolaas Anne - Eindhoven NL
van Veen; Gerard Nicolaas Anne - Waalre NL
van Veen; Gerard Nicolaas Anne - Waarle NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Multi-electron-beam imaging apparatus with improved performance Grant 10,971,326 - Mohammadi-Gheidari , et al. April 6, 2	2021-04-06
EELS detection technique in an electron microscope Grant 10,832,901 - Freitag , et al. November 10, 2	2020-11-10
Innovative source assembly for ion beam production Grant 10,651,005 - Kouwen , et al.	2020-05-12
Multi-electron-beam Imaging Apparatus With Improved Performance App 20200090899 - Mohammadi-Gheidari; Ali ; et al.	2020-03-19
Eels Detection Technique In An Electron Microscope App 20190341243 - Freitag; Bert Henning ; et al.	2019-11-07
Emission noise correction of a charged particle source Grant 10,453,647 - Mohammadi-Gheidari , et al. Oc	2019-10-22
Emission Noise Correction Of A Charged Particle Source App 20180233322 - Gheidari; Ali Mohammadi ; et al.	2018-08-16
Innovative Source Assembly For Ion Beam Production App 20180218875 - Kouwen; Leon van ; et al.	2018-08-02
Innovative source assembly for ion beam production Grant 9,941,094 - van Kouwen , et al. April 10, 2	2018-04-10
Charged particle microscope with improved spectroscopic functionality Grant 9,812,287 - Kooijman , et al. November 7, 2	2017-11-07
Method of performing spectroscopy in a transmission charged-particle microscope Grant 9,778,377 - Mele , et al. October 3, 2	2017-10-03
Micro-chamber for inspecting sample material Grant 9,741,529 - Mele , et al. August 22, 2	2017-08-22
Mathematical image assembly in a scanning-type microscope Grant 9,620,330 - April 11, 2	2017-04-11
Micro-chamber For Inspecting Sample Material App 20170032928 - Mele; Luigi ; et al.	2017-02-02
Method Of Performing Spectroscopy In A Transmission Charged-particle Microscope App 20160276130 - Mele; Luigi ; et al.	2016-09-22
Charged Particle Microscope With Improved Spectroscopic Functionality App 20160189922 - Kooijman; Cornelis Sander ; et al.	2016-06-30
Radiation Sensor, and its Application in a Charged-Particle Microscope App 20160056015 - van Veen; Gerard Nicolaas Anne ; et al.	2016-02-25
Radiation detector Grant 8,450,820 - Nanver , et al. May 28, 2	2013-05-28
Radiation Detector App 20110169116 - Nanver; Lis Karen ; et al.	2011-07-14
Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus Grant 7,474,419 - Tappel , et al. January 6, 2	2009-01-06
Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus App 20070125958 - Tappel; Hendrik Gezinus ; et al.	2007-06-07
Method for the manufacture and transmissive irradiation of a sample, and particle-optical system Grant 6,963,068 - Asselbergs , et al. November 8, 2	2005-11-08

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