Van Setten; Eelco
Patent Applications and Registrations
Patent applications and USPTO patent grants for Van Setten; Eelco.The latest application filed is for "methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing".
- Van Setten; Eelco - Waalre NL
- Van Setten; Eelco - Eindhoven NL
| Patent | Date |
|---|---|
| Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing method Grant 11,314,174 - De Winter , et al. April 26, 2 | 2022-04-26 |
| Patterning device Grant 10,928,735 - Van De Kerkhof , et al. February 23, 2 | 2021-02-23 |
| Methods and Patterning Devices and Apparatuses for Measuring Focus Performance of a Lithographic Apparatus, Device Manufacturing App 20200264522 - DE WINTER; Laurentius Cornelius ; et al. | 2020-08-20 |
| Patterning Device App 20200096875 - VAN DE KERKHOF; Marcus Adrianus ; et al. | 2020-03-26 |
| Method of characterizing, method of forming a model, method of simulating, mask manufacturing method and device manufacturing method Grant 9,798,225 - Van Setten , et al. October 24, 2 | 2017-10-24 |
| Method Of Characterizing, Method Of Forming A Model, Method Of Simulating, Mask Manufacturing Method And Device Manufacturing Method App 20160266483 - VAN SETTEN; Eelco ; et al. | 2016-09-15 |
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