VAN LEEUWEN; Robbert Edgar

Patent Applications and Registrations

Patent applications and USPTO patent grants for VAN LEEUWEN; Robbert Edgar.The latest application filed is for "optical fibers and production methods therefor".

Company Profile

4.18.12

VAN LEEUWEN; Robbert Edgar - Eindhoven NL
- Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Fibers And Production Methods Therefor App 20210387892 - VAN LEEUWEN; Robbert Edgar ; et al.	2021-12-16
Actuator system and lithographic apparatus Grant 10,338,483 - Van Leeuwen , et al.	2019-07-02
Position measurement system and lithographic apparatus Grant 10,331,045 - Van Der Pasch , et al.	2019-06-25
Position measurement system, interferometer and lithographic apparatus Grant 10,289,011 - Van Der Pasch , et al.	2019-05-14
Actuator System And Lithographic Apparatus App 20190079416 - VAN LEEUWEN; Robbert Edgar ; et al.	2019-03-14
Stage apparatus, lithographic apparatus and method of positioning an object table Grant 9,915,880 - Van Der Pasch , et al. March 13, 2	2018-03-13
Stage Apparatus, Lithographic Apparatus And Method Of Positioning An Object Table App 20160223917 - VAN DER PASCH; Engelbertus Antonius Fransiscus ; et al.	2016-08-04
Lithographic apparatus, method of deforming a substrate table and device manufacturing method Grant 9,329,501 - Huang , et al. May 3, 2	2016-05-03
Stage apparatus, lithographic apparatus and method of positioning an object table Grant 9,316,928 - Van Der Pasch , et al. April 19, 2	2016-04-19
Position measurement system, lithographic apparatus and device manufacturing method Grant 08922756 -	2014-12-30
Position measurement system, lithographic apparatus and device manufacturing method Grant 8,922,756 - Koenen , et al. December 30, 2	2014-12-30
Lithographic apparatus and device manufacturing method Grant 8,675,175 - George , et al. March 18, 2	2014-03-18
Encoder-type measurement system, lithographic apparatus and method to detect an error on or in a grid or grating of an encoder-type measurement system Grant 8,614,783 - Eussen , et al. December 24, 2	2013-12-24
Lithographic Apparatus and Device Manufacturing Method App 20130201466 - GEORGE; Richard Alexander ; et al.	2013-08-08
Lithographic apparatus and device manufacturing method Grant 8,395,755 - George , et al. March 12, 2	2013-03-12
Position Measurement System, Lithographic Apparatus And Device Manufacturing Method App 20130050670 - Koenen; Willem Herman Gertruda Anna ; et al.	2013-02-28
Lithographic Apparatus, Method Of Deforming A Substrate Table And Device Manufacturing Method App 20120327386 - Huang; Yang-Shan ; et al.	2012-12-27
Stage Apparatus, Lithographic Apparatus And Method Of Positioning An Object Table App 20120050709 - VAN DER PASCH; Engelbertus Antonius Fransiscus ; et al.	2012-03-01
Lithographic Apparatus and Device Manufacturing Method App 20090284720 - George; Richard Alexander ; et al.	2009-11-19
Encoder-type Measurement System, Lithographic Apparatus And Method To Detect An Error On Or In A Grid Or Grating Of An Encoder-type Measurement System App 20090237634 - EUSSEN; Emiel Jozef Melanie ; et al.	2009-09-24
Lithographic apparatus and device manufacturing method Grant 7,576,834 - George , et al. August 18, 2	2009-08-18
Lithographic apparatus and device manufacturing method App 20080218718 - George; Richard Alexander ; et al.	2008-09-11
Lithographic apparatus and device manufacturing method Grant 7,385,675 - George , et al. June 10, 2	2008-06-10
System and method of measurement, system and method of alignment, lithographic apparatus and method Grant 7,280,228 - Nijmeijer , et al. October 9, 2	2007-10-09
System and method of measurement, system and method of alignment, lithographic apparatus and method App 20050046845 - Nijmeijer, Gerrit Johannes ; et al.	2005-03-03

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