loadpatents
name:-0.0077619552612305
name:-0.0076749324798584
name:-0.0079200267791748
van Kessel; Theodore Patent Filings

van Kessel; Theodore

Patent Applications and Registrations

Patent applications and USPTO patent grants for van Kessel; Theodore.The latest application filed is for "plume characterization using synchronized measurements of gas composition, wind direction, and wind speed".

Company Profile
7.6.6
  • van Kessel; Theodore - Millbrook NY
  • Van Kessel; Theodore - Yorktown Heights NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Plume characterization using synchronized measurements of gas composition, wind direction, and wind speed
Grant 11,079,366 - Klein , et al. August 3, 2
2021-08-03
Heuristic based analytics for gas leak source identification
Grant 10,775,258 - Muralidhar , et al. Sept
2020-09-15
Event clustering and event series characterization based on expected frequency
Grant 10,706,080 - Albrecht , et al.
2020-07-07
Accelerometer using dimagnetic levitation
Grant 10,564,175 - Elmegreen , et al. Feb
2020-02-18
Heuristic Based Analytics for Gas Leak Source Identification
App 20190285504 - Muralidhar; Ramachandran ;   et al.
2019-09-19
Plume Characterization Using Synchronized Measurements Of Gas Composition, Wind Direction, And Wind Speed
App 20190285600 - Klein; Levente ;   et al.
2019-09-19
Transparent electronics for invisible smart dust applications
Grant 10,396,061 - Li , et al. A
2019-08-27
Event Driven Gas Sensing And Source Attribution
App 20190187020 - Green; William ;   et al.
2019-06-20
Accelerometer Using Dimagnetic Levitation
App 20190162751 - Elmegreen; Bruce G. ;   et al.
2019-05-30
Event Clustering & Event Series Chracterization On Expected Frequency
App 20190102449 - ALBRECHT; CONRAD M. ;   et al.
2019-04-04
Measurement System For Determining The Thickness Of A Layer During A Plating Process
App 20050168750 - Laue, Christian ;   et al.
2005-08-04
In-situ wafer temperature control apparatus for single wafer tools
Grant 5,667,622 - Hasegawa , et al. September 16, 1
1997-09-16

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